JPS57161565A - System for testing malfunctioning or normal functioning of logic circuit - Google Patents

System for testing malfunctioning or normal functioning of logic circuit

Info

Publication number
JPS57161565A
JPS57161565A JP57038830A JP3883082A JPS57161565A JP S57161565 A JPS57161565 A JP S57161565A JP 57038830 A JP57038830 A JP 57038830A JP 3883082 A JP3883082 A JP 3883082A JP S57161565 A JPS57161565 A JP S57161565A
Authority
JP
Japan
Prior art keywords
malfunctioning
testing
logic circuit
normal functioning
functioning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57038830A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0213750B2 (enExample
Inventor
Rabuiron Andore
Beraaru Kuroodo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS57161565A publication Critical patent/JPS57161565A/ja
Publication of JPH0213750B2 publication Critical patent/JPH0213750B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
JP57038830A 1981-03-11 1982-03-11 System for testing malfunctioning or normal functioning of logic circuit Granted JPS57161565A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8104868A FR2501867A1 (fr) 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques

Publications (2)

Publication Number Publication Date
JPS57161565A true JPS57161565A (en) 1982-10-05
JPH0213750B2 JPH0213750B2 (enExample) 1990-04-05

Family

ID=9256112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57038830A Granted JPS57161565A (en) 1981-03-11 1982-03-11 System for testing malfunctioning or normal functioning of logic circuit

Country Status (5)

Country Link
US (1) US4520309A (enExample)
EP (1) EP0060194B1 (enExample)
JP (1) JPS57161565A (enExample)
DE (1) DE3262367D1 (enExample)
FR (1) FR2501867A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2568015B1 (fr) * 1984-07-18 1986-08-08 Commissariat Energie Atomique Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
FR2626422B1 (fr) * 1988-01-27 1994-04-15 Elf Aquitaine Ste Nale Circuit logique a structure programmable, procede de cablage d'un arbre et dispositif de mise en oeuvre du procede de cablage

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3842346A (en) * 1972-12-20 1974-10-15 C Bobbitt Continuity testing of solid state circuitry during temperature cycling
US3881260A (en) * 1973-07-05 1975-05-06 James M Hombs Self-teaching machine for binary logic
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3927371A (en) * 1974-02-19 1975-12-16 Ibm Test system for large scale integrated circuits
US3961250A (en) * 1974-05-08 1976-06-01 International Business Machines Corporation Logic network test system with simulator oriented fault test generator
US4013951A (en) * 1974-08-02 1977-03-22 Nissan Motor Co., Ltd. Circuit testing apparatus
US4222514A (en) * 1978-11-30 1980-09-16 Sperry Corporation Digital tester
US4308616A (en) * 1979-05-29 1981-12-29 Timoc Constantin C Structure for physical fault simulation of digital logic

Also Published As

Publication number Publication date
FR2501867B1 (enExample) 1983-04-15
FR2501867A1 (fr) 1982-09-17
EP0060194B1 (fr) 1985-02-20
EP0060194A1 (fr) 1982-09-15
US4520309A (en) 1985-05-28
JPH0213750B2 (enExample) 1990-04-05
DE3262367D1 (en) 1985-03-28

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