DE3262367D1 - System for testing failure or good functioning of a circuit consisting of logic components - Google Patents

System for testing failure or good functioning of a circuit consisting of logic components

Info

Publication number
DE3262367D1
DE3262367D1 DE8282400377T DE3262367T DE3262367D1 DE 3262367 D1 DE3262367 D1 DE 3262367D1 DE 8282400377 T DE8282400377 T DE 8282400377T DE 3262367 T DE3262367 T DE 3262367T DE 3262367 D1 DE3262367 D1 DE 3262367D1
Authority
DE
Germany
Prior art keywords
circuit consisting
logic components
good functioning
testing failure
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282400377T
Other languages
German (de)
English (en)
Inventor
Andre Laviron
Claude Berard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE3262367D1 publication Critical patent/DE3262367D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
DE8282400377T 1981-03-11 1982-03-04 System for testing failure or good functioning of a circuit consisting of logic components Expired DE3262367D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8104868A FR2501867A1 (fr) 1981-03-11 1981-03-11 Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques

Publications (1)

Publication Number Publication Date
DE3262367D1 true DE3262367D1 (en) 1985-03-28

Family

ID=9256112

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282400377T Expired DE3262367D1 (en) 1981-03-11 1982-03-04 System for testing failure or good functioning of a circuit consisting of logic components

Country Status (5)

Country Link
US (1) US4520309A (enExample)
EP (1) EP0060194B1 (enExample)
JP (1) JPS57161565A (enExample)
DE (1) DE3262367D1 (enExample)
FR (1) FR2501867A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2568015B1 (fr) * 1984-07-18 1986-08-08 Commissariat Energie Atomique Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
FR2626422B1 (fr) * 1988-01-27 1994-04-15 Elf Aquitaine Ste Nale Circuit logique a structure programmable, procede de cablage d'un arbre et dispositif de mise en oeuvre du procede de cablage

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3815025A (en) * 1971-10-18 1974-06-04 Ibm Large-scale integrated circuit testing structure
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
US3842346A (en) * 1972-12-20 1974-10-15 C Bobbitt Continuity testing of solid state circuitry during temperature cycling
US3881260A (en) * 1973-07-05 1975-05-06 James M Hombs Self-teaching machine for binary logic
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3927371A (en) * 1974-02-19 1975-12-16 Ibm Test system for large scale integrated circuits
US3961250A (en) * 1974-05-08 1976-06-01 International Business Machines Corporation Logic network test system with simulator oriented fault test generator
US4013951A (en) * 1974-08-02 1977-03-22 Nissan Motor Co., Ltd. Circuit testing apparatus
US4222514A (en) * 1978-11-30 1980-09-16 Sperry Corporation Digital tester
US4308616A (en) * 1979-05-29 1981-12-29 Timoc Constantin C Structure for physical fault simulation of digital logic

Also Published As

Publication number Publication date
JPH0213750B2 (enExample) 1990-04-05
FR2501867B1 (enExample) 1983-04-15
JPS57161565A (en) 1982-10-05
EP0060194B1 (fr) 1985-02-20
US4520309A (en) 1985-05-28
FR2501867A1 (fr) 1982-09-17
EP0060194A1 (fr) 1982-09-15

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee