JPS57153273U - - Google Patents
Info
- Publication number
- JPS57153273U JPS57153273U JP3991681U JP3991681U JPS57153273U JP S57153273 U JPS57153273 U JP S57153273U JP 3991681 U JP3991681 U JP 3991681U JP 3991681 U JP3991681 U JP 3991681U JP S57153273 U JPS57153273 U JP S57153273U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981039916U JPH0412469Y2 (enExample) | 1981-03-20 | 1981-03-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981039916U JPH0412469Y2 (enExample) | 1981-03-20 | 1981-03-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57153273U true JPS57153273U (enExample) | 1982-09-25 |
| JPH0412469Y2 JPH0412469Y2 (enExample) | 1992-03-25 |
Family
ID=29837033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1981039916U Expired JPH0412469Y2 (enExample) | 1981-03-20 | 1981-03-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0412469Y2 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009097968A (ja) * | 2007-10-16 | 2009-05-07 | Akim Kk | 温度特性計測装置および温度特性計測方法 |
| JP2018004449A (ja) * | 2016-07-01 | 2018-01-11 | 三菱電機株式会社 | 測定装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5011973U (enExample) * | 1973-06-04 | 1975-02-06 | ||
| JPS5521158A (en) * | 1978-08-01 | 1980-02-15 | Nec Corp | Checking method for semiconductor device |
-
1981
- 1981-03-20 JP JP1981039916U patent/JPH0412469Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5011973U (enExample) * | 1973-06-04 | 1975-02-06 | ||
| JPS5521158A (en) * | 1978-08-01 | 1980-02-15 | Nec Corp | Checking method for semiconductor device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009097968A (ja) * | 2007-10-16 | 2009-05-07 | Akim Kk | 温度特性計測装置および温度特性計測方法 |
| JP2018004449A (ja) * | 2016-07-01 | 2018-01-11 | 三菱電機株式会社 | 測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0412469Y2 (enExample) | 1992-03-25 |