JPS57153273U - - Google Patents

Info

Publication number
JPS57153273U
JPS57153273U JP3991681U JP3991681U JPS57153273U JP S57153273 U JPS57153273 U JP S57153273U JP 3991681 U JP3991681 U JP 3991681U JP 3991681 U JP3991681 U JP 3991681U JP S57153273 U JPS57153273 U JP S57153273U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3991681U
Other languages
Japanese (ja)
Other versions
JPH0412469Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981039916U priority Critical patent/JPH0412469Y2/ja
Publication of JPS57153273U publication Critical patent/JPS57153273U/ja
Application granted granted Critical
Publication of JPH0412469Y2 publication Critical patent/JPH0412469Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1981039916U 1981-03-20 1981-03-20 Expired JPH0412469Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981039916U JPH0412469Y2 (enrdf_load_stackoverflow) 1981-03-20 1981-03-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981039916U JPH0412469Y2 (enrdf_load_stackoverflow) 1981-03-20 1981-03-20

Publications (2)

Publication Number Publication Date
JPS57153273U true JPS57153273U (enrdf_load_stackoverflow) 1982-09-25
JPH0412469Y2 JPH0412469Y2 (enrdf_load_stackoverflow) 1992-03-25

Family

ID=29837033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981039916U Expired JPH0412469Y2 (enrdf_load_stackoverflow) 1981-03-20 1981-03-20

Country Status (1)

Country Link
JP (1) JPH0412469Y2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009097968A (ja) * 2007-10-16 2009-05-07 Akim Kk 温度特性計測装置および温度特性計測方法
JP2018004449A (ja) * 2016-07-01 2018-01-11 三菱電機株式会社 測定装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011973U (enrdf_load_stackoverflow) * 1973-06-04 1975-02-06
JPS5521158A (en) * 1978-08-01 1980-02-15 Nec Corp Checking method for semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5011973U (enrdf_load_stackoverflow) * 1973-06-04 1975-02-06
JPS5521158A (en) * 1978-08-01 1980-02-15 Nec Corp Checking method for semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009097968A (ja) * 2007-10-16 2009-05-07 Akim Kk 温度特性計測装置および温度特性計測方法
JP2018004449A (ja) * 2016-07-01 2018-01-11 三菱電機株式会社 測定装置

Also Published As

Publication number Publication date
JPH0412469Y2 (enrdf_load_stackoverflow) 1992-03-25

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