JPS57134798A - Measring apparatus - Google Patents

Measring apparatus

Info

Publication number
JPS57134798A
JPS57134798A JP56204506A JP20450681A JPS57134798A JP S57134798 A JPS57134798 A JP S57134798A JP 56204506 A JP56204506 A JP 56204506A JP 20450681 A JP20450681 A JP 20450681A JP S57134798 A JPS57134798 A JP S57134798A
Authority
JP
Japan
Prior art keywords
measring
transmission frequency
changes
interferometer
beating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56204506A
Other languages
English (en)
Inventor
Jiyosefu Buratsudoree Danieru
Toomasu Marei Robaato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Imperial Chemical Industries Ltd
Original Assignee
Imperial Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imperial Chemical Industries Ltd filed Critical Imperial Chemical Industries Ltd
Publication of JPS57134798A publication Critical patent/JPS57134798A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Optical Transform (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
JP56204506A 1980-12-17 1981-12-17 Measring apparatus Pending JPS57134798A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8040393 1980-12-17

Publications (1)

Publication Number Publication Date
JPS57134798A true JPS57134798A (en) 1982-08-20

Family

ID=10518034

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56204506A Pending JPS57134798A (en) 1980-12-17 1981-12-17 Measring apparatus

Country Status (5)

Country Link
US (1) US4417815A (ja)
EP (1) EP0058801B1 (ja)
JP (1) JPS57134798A (ja)
AT (1) ATE25430T1 (ja)
DE (1) DE3175909D1 (ja)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4533249A (en) * 1982-09-30 1985-08-06 Honeywell Inc. Passive ring resonator angular rate sensor
US4945230A (en) * 1984-07-06 1990-07-31 Metricor, Inc. Optical measuring device using a spectral modulation sensor having an optically resonant structure
US4678904A (en) * 1984-07-06 1987-07-07 Technology Dynamics, Inc. Optical measuring device using a spectral modulation sensor having an optically resonant structure
GB2182433B (en) * 1985-11-02 1989-10-25 Stc Plc Remote sensor
US4856899A (en) * 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
DE3820170A1 (de) * 1988-06-14 1989-12-21 Messerschmitt Boelkow Blohm Messgeber zur messung physikalischer groessen
FR2634560B1 (fr) * 1988-07-19 1990-11-30 France Etat Armement Systemes de mesure electro-optiques pour l'analyse frequentielle de signaux a tres large bande
AU658824B2 (en) * 1990-04-23 1995-05-04 Commonwealth Scientific And Industrial Research Organisation Interferometry systems and methods
WO1991016597A1 (en) * 1990-04-23 1991-10-31 Commonwealth Scientific And Industrial Research Organisation Interferometry systems and methods
US5917966A (en) * 1995-12-14 1999-06-29 Motorola Inc. Interferometric optical chemical sensor
US20080297808A1 (en) * 2005-12-06 2008-12-04 Nabeel Agha Riza Optical Sensor For Extreme Environments
US7852490B2 (en) * 2007-02-05 2010-12-14 Palo Alto Research Center Incorporated Implanting optical cavity structures
WO2010008789A2 (en) * 2008-06-23 2010-01-21 University Of South Florida Interferometric chemical sensor array
CN109444079B (zh) * 2018-12-12 2023-08-01 中国计量大学 一种光纤测氧气传感器

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3551051A (en) * 1967-08-18 1970-12-29 Gen Electrodynamics Corp Infra-red detectors
DE2306091C3 (de) * 1973-02-08 1975-10-30 Hewlett-Packard Gmbh, 7030 Boeblingen Interferenz-Refraktometer
US3939348A (en) * 1974-06-11 1976-02-17 Allied Chemical Corporation Infrared gas analysis
US4329058A (en) * 1979-01-22 1982-05-11 Rockwell International Corporation Method and apparatus for a Fabry-Perot multiple beam fringe sensor
US4355898A (en) * 1979-05-23 1982-10-26 Plessey Overseas Limited Optical detecting, monitoring or measuring arrangements

Also Published As

Publication number Publication date
EP0058801B1 (en) 1987-02-04
ATE25430T1 (de) 1987-02-15
US4417815A (en) 1983-11-29
EP0058801A1 (en) 1982-09-01
DE3175909D1 (en) 1987-03-12

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