JPS5713376A - Automatic measuring method for noise voltage - Google Patents

Automatic measuring method for noise voltage

Info

Publication number
JPS5713376A
JPS5713376A JP8659980A JP8659980A JPS5713376A JP S5713376 A JPS5713376 A JP S5713376A JP 8659980 A JP8659980 A JP 8659980A JP 8659980 A JP8659980 A JP 8659980A JP S5713376 A JPS5713376 A JP S5713376A
Authority
JP
Japan
Prior art keywords
semiconductor
noise voltage
measured
current
current setting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8659980A
Other languages
Japanese (ja)
Inventor
Toshiharu Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8659980A priority Critical patent/JPS5713376A/en
Publication of JPS5713376A publication Critical patent/JPS5713376A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To provide a device that selects and connects individual semiconductor in turn to a current setting system, applys a current which is within the extent that breakdown does not occur, and whose level is changed, from the current setting system to so selected and connected semiconductor, and automatically records a fall voltage. CONSTITUTION:A housing holding system 1 houses and holds a plural number of semiconductor parts to be measured through the medium of an electric connection part, the individual semiconductor part to be measured is connected in turn to a current setting system 3 by means of a switching system 2, and a current, which varies in level, is continuously supplied and applied in a pulsating manner in the reverse direction. This causes production of a noise voltage, which varies in capacity, at the semiconductor part to be measured, and after an A-D converting system 6 converts the noise voltage via a voltage measuring system 5 by a printing system 7, a printing system 7 records it. The reason why the A-D conversion takes place is that it is processed more efficiently than a process in which the noise voltage is recorded as an analogue signal, and the semiconductor parts are classified into each class according to the measurement, whereby the individual semiconductor part can be evaluated efficiently.
JP8659980A 1980-06-27 1980-06-27 Automatic measuring method for noise voltage Pending JPS5713376A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8659980A JPS5713376A (en) 1980-06-27 1980-06-27 Automatic measuring method for noise voltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8659980A JPS5713376A (en) 1980-06-27 1980-06-27 Automatic measuring method for noise voltage

Publications (1)

Publication Number Publication Date
JPS5713376A true JPS5713376A (en) 1982-01-23

Family

ID=13891470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8659980A Pending JPS5713376A (en) 1980-06-27 1980-06-27 Automatic measuring method for noise voltage

Country Status (1)

Country Link
JP (1) JPS5713376A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015089346A1 (en) * 2013-12-13 2015-06-18 Battelle Memorial Institute Electronic component classification
US10789550B2 (en) 2017-04-13 2020-09-29 Battelle Memorial Institute System and method for generating test vectors

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015089346A1 (en) * 2013-12-13 2015-06-18 Battelle Memorial Institute Electronic component classification
US9759757B2 (en) 2013-12-13 2017-09-12 Battelle Memorial Institute Electronic component classification
US10054624B2 (en) 2013-12-13 2018-08-21 Battelle Memorial Institute Electronic component classification
US10416219B2 (en) 2013-12-13 2019-09-17 Battelle Memorial Institute Electronic component classification
US10761127B2 (en) 2013-12-13 2020-09-01 Battelle Memorial Institute Electronic component classification
US10789550B2 (en) 2017-04-13 2020-09-29 Battelle Memorial Institute System and method for generating test vectors

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