JPS57129111U - - Google Patents
Info
- Publication number
- JPS57129111U JPS57129111U JP1467881U JP1467881U JPS57129111U JP S57129111 U JPS57129111 U JP S57129111U JP 1467881 U JP1467881 U JP 1467881U JP 1467881 U JP1467881 U JP 1467881U JP S57129111 U JPS57129111 U JP S57129111U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
- G01D1/14—Measuring arrangements giving results other than momentary value of variable, of general application giving a distribution function of a value, i.e. number of times the value comes within specified ranges of amplitude
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1467881U JPS57129111U (en) | 1981-02-04 | 1981-02-04 | |
| NL8200300A NL8200300A (en) | 1981-02-04 | 1982-01-27 | DEVICE FOR RECORDING PULSE HEIGHT DISTRIBUTION FOR USE IN A FILM THICKNESS METER USING FLUORESCENT X-RADIATION. |
| GB8202550A GB2096313A (en) | 1981-02-04 | 1982-01-29 | An apparatus for indicating pulse height distribution for use with a fluorescent X-ray film thickness meter |
| CA000395563A CA1163022A (en) | 1981-02-04 | 1982-02-04 | Apparatus for recording pulse height distribution in a fluorescent x-ray film thickness meter |
| FR8201803A FR2499240A1 (en) | 1981-02-04 | 1982-02-04 | IMPULSE HEIGHT DISTRIBUTION RECORDING DEVICE FOR X-RAY FLUORESCENCE FILM THICKNESS MEASURING INSTRUMENT |
| DE19823203746 DE3203746A1 (en) | 1981-02-04 | 1982-02-04 | DEVICE FOR RECORDING A PULSE HEIGHT DISTRIBUTION |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1467881U JPS57129111U (en) | 1981-02-04 | 1981-02-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57129111U true JPS57129111U (en) | 1982-08-12 |
Family
ID=11867869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1467881U Pending JPS57129111U (en) | 1981-02-04 | 1981-02-04 |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS57129111U (en) |
| CA (1) | CA1163022A (en) |
| DE (1) | DE3203746A1 (en) |
| FR (1) | FR2499240A1 (en) |
| GB (1) | GB2096313A (en) |
| NL (1) | NL8200300A (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3440537A (en) * | 1963-08-20 | 1969-04-22 | Non Linear Systems Inc | Bar-graph display instrument |
| JPS5810098Y2 (en) * | 1973-05-07 | 1983-02-24 | 株式会社小松製作所 | Yuatsu Sokutei Souchi |
| US4129827A (en) * | 1976-05-20 | 1978-12-12 | Southwick R | Amplitude probability detector |
-
1981
- 1981-02-04 JP JP1467881U patent/JPS57129111U/ja active Pending
-
1982
- 1982-01-27 NL NL8200300A patent/NL8200300A/en not_active Application Discontinuation
- 1982-01-29 GB GB8202550A patent/GB2096313A/en not_active Withdrawn
- 1982-02-04 CA CA000395563A patent/CA1163022A/en not_active Expired
- 1982-02-04 FR FR8201803A patent/FR2499240A1/en active Pending
- 1982-02-04 DE DE19823203746 patent/DE3203746A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| DE3203746A1 (en) | 1982-09-02 |
| GB2096313A (en) | 1982-10-13 |
| FR2499240A1 (en) | 1982-08-06 |
| NL8200300A (en) | 1982-09-01 |
| CA1163022A (en) | 1984-02-28 |