JPS57108744A - Sample supporting table - Google Patents

Sample supporting table

Info

Publication number
JPS57108744A
JPS57108744A JP55186785A JP18678580A JPS57108744A JP S57108744 A JPS57108744 A JP S57108744A JP 55186785 A JP55186785 A JP 55186785A JP 18678580 A JP18678580 A JP 18678580A JP S57108744 A JPS57108744 A JP S57108744A
Authority
JP
Japan
Prior art keywords
battery
sample
rotated
supporting table
well
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55186785A
Other languages
Japanese (ja)
Inventor
Kenjiro Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Suwa Seikosha KK
Original Assignee
Seiko Epson Corp
Suwa Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp, Suwa Seikosha KK filed Critical Seiko Epson Corp
Priority to JP55186785A priority Critical patent/JPS57108744A/en
Publication of JPS57108744A publication Critical patent/JPS57108744A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To permit the analysis of the entire part of the deposit produced circumferentially in a button type battery or the like and also make the quantitative tracing of secular change possible by fixing the sample on a sample supporting table and so constituting the table that it can be rotated. CONSTITUTION:A button type battery 5 is fixed in a sample cup 6 on a sample table 1 by means of a set screw 7 for the purpose of leakage inspection and is set to a scanning type electron microscope. When a motor 2 is run, the battery 5 is rotated as well by means of a belt 3. It is possible to detect fluorescent X- rays uniformly from the entire part of the packing of the battery by regulating the scanning speed of an electron beam 13 and the rotating speed of the battery 5, and partial leakage is detected as well.
JP55186785A 1980-12-26 1980-12-26 Sample supporting table Pending JPS57108744A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55186785A JPS57108744A (en) 1980-12-26 1980-12-26 Sample supporting table

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186785A JPS57108744A (en) 1980-12-26 1980-12-26 Sample supporting table

Publications (1)

Publication Number Publication Date
JPS57108744A true JPS57108744A (en) 1982-07-06

Family

ID=16194545

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186785A Pending JPS57108744A (en) 1980-12-26 1980-12-26 Sample supporting table

Country Status (1)

Country Link
JP (1) JPS57108744A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7643608B2 (en) * 2004-12-28 2010-01-05 Panasonic Corporation Method for checking for leakage from tubular batteries

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7643608B2 (en) * 2004-12-28 2010-01-05 Panasonic Corporation Method for checking for leakage from tubular batteries

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