JPS571080B2 - - Google Patents
Info
- Publication number
- JPS571080B2 JPS571080B2 JP12880576A JP12880576A JPS571080B2 JP S571080 B2 JPS571080 B2 JP S571080B2 JP 12880576 A JP12880576 A JP 12880576A JP 12880576 A JP12880576 A JP 12880576A JP S571080 B2 JPS571080 B2 JP S571080B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Static Random-Access Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12880576A JPS5354481A (en) | 1976-10-28 | 1976-10-28 | Testing system of non-volatile memory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12880576A JPS5354481A (en) | 1976-10-28 | 1976-10-28 | Testing system of non-volatile memory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5354481A JPS5354481A (en) | 1978-05-17 |
| JPS571080B2 true JPS571080B2 (show.php) | 1982-01-09 |
Family
ID=14993850
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12880576A Granted JPS5354481A (en) | 1976-10-28 | 1976-10-28 | Testing system of non-volatile memory |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5354481A (show.php) |
-
1976
- 1976-10-28 JP JP12880576A patent/JPS5354481A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5354481A (en) | 1978-05-17 |