JPS5354481A - Testing system of non-volatile memory - Google Patents

Testing system of non-volatile memory

Info

Publication number
JPS5354481A
JPS5354481A JP12880576A JP12880576A JPS5354481A JP S5354481 A JPS5354481 A JP S5354481A JP 12880576 A JP12880576 A JP 12880576A JP 12880576 A JP12880576 A JP 12880576A JP S5354481 A JPS5354481 A JP S5354481A
Authority
JP
Japan
Prior art keywords
volatile memory
testing system
linear
varoable
quaranteeing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12880576A
Other languages
Japanese (ja)
Other versions
JPS571080B2 (en
Inventor
Yukimasa Uchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP12880576A priority Critical patent/JPS5354481A/en
Publication of JPS5354481A publication Critical patent/JPS5354481A/en
Publication of JPS571080B2 publication Critical patent/JPS571080B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)

Abstract

PURPOSE: To measure the upper limit of threshold voltages necessary for quaranteeing storage characteristics by applying a power supply voltage through negative resistors having linear or non-linear current voltage characteristics to the respective drains of varoable threshold value FETs comprising commonly connecting a plurality.
COPYRIGHT: (C)1978,JPO&Japio
JP12880576A 1976-10-28 1976-10-28 Testing system of non-volatile memory Granted JPS5354481A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12880576A JPS5354481A (en) 1976-10-28 1976-10-28 Testing system of non-volatile memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12880576A JPS5354481A (en) 1976-10-28 1976-10-28 Testing system of non-volatile memory

Publications (2)

Publication Number Publication Date
JPS5354481A true JPS5354481A (en) 1978-05-17
JPS571080B2 JPS571080B2 (en) 1982-01-09

Family

ID=14993850

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12880576A Granted JPS5354481A (en) 1976-10-28 1976-10-28 Testing system of non-volatile memory

Country Status (1)

Country Link
JP (1) JPS5354481A (en)

Also Published As

Publication number Publication date
JPS571080B2 (en) 1982-01-09

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