JPS57100732A - Dry etching device - Google Patents

Dry etching device

Info

Publication number
JPS57100732A
JPS57100732A JP17791980A JP17791980A JPS57100732A JP S57100732 A JPS57100732 A JP S57100732A JP 17791980 A JP17791980 A JP 17791980A JP 17791980 A JP17791980 A JP 17791980A JP S57100732 A JPS57100732 A JP S57100732A
Authority
JP
Japan
Prior art keywords
trap
chamber
drain pipe
dry etching
etching device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17791980A
Other languages
Japanese (ja)
Inventor
Hiroshi Koshimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP17791980A priority Critical patent/JPS57100732A/en
Publication of JPS57100732A publication Critical patent/JPS57100732A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/18Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H01J37/185Means for transferring objects between different enclosures of different pressure or atmosphere

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To eliminate a defect adhered to an etched material by heating the inner wall and drain pipe of a chamber and forming a trap at a drain pump, thereby adsorbing all the reactive products to the trap. CONSTITUTION:Since the inner wall and drain pipe 3 of a chamber 1 are heated, reactive product or sludge of photoresist are not readhered thereto but are always conveyed to a trap 4 and are adsorbed to the trap 4. In this manner, the reactive product and the sludge of the resist thus adsorbed to the trap can not be again raised through the drain pipe to be scattered in the chamber, thereby eliminating the defect at the etched material.
JP17791980A 1980-12-16 1980-12-16 Dry etching device Pending JPS57100732A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17791980A JPS57100732A (en) 1980-12-16 1980-12-16 Dry etching device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17791980A JPS57100732A (en) 1980-12-16 1980-12-16 Dry etching device

Publications (1)

Publication Number Publication Date
JPS57100732A true JPS57100732A (en) 1982-06-23

Family

ID=16039353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17791980A Pending JPS57100732A (en) 1980-12-16 1980-12-16 Dry etching device

Country Status (1)

Country Link
JP (1) JPS57100732A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62107439U (en) * 1985-12-25 1987-07-09
JPH0215623A (en) * 1988-04-25 1990-01-19 Applied Materials Inc Magnetic field enhancing plasma etching reactor
JPH0291277U (en) * 1988-12-28 1990-07-19
JPH0472724A (en) * 1990-07-13 1992-03-06 Sony Corp Dryetching process
JP4459297B1 (en) * 2009-12-25 2010-04-28 株式会社日立国際電気 Semiconductor manufacturing apparatus, valve apparatus, CVD processing method using semiconductor manufacturing apparatus, and semiconductor manufacturing method
JP2010116627A (en) * 2009-12-25 2010-05-27 Hitachi Kokusai Electric Inc Semiconductor manufacturing equipment, valve device, cvd treatment method using the semiconductor manufacturing equipment, and method of manufacturing semiconductor
JP2010189767A (en) * 2010-04-15 2010-09-02 Hitachi Kokusai Electric Inc Apparatus for manufacturing semiconductor, valve device, cvd treatment method using valve device, and method of manufacturing semiconductor

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62107439U (en) * 1985-12-25 1987-07-09
JPH0528757Y2 (en) * 1985-12-25 1993-07-23
JPH0215623A (en) * 1988-04-25 1990-01-19 Applied Materials Inc Magnetic field enhancing plasma etching reactor
JPH0291277U (en) * 1988-12-28 1990-07-19
JPH0444948Y2 (en) * 1988-12-28 1992-10-22
JPH0472724A (en) * 1990-07-13 1992-03-06 Sony Corp Dryetching process
JP4459297B1 (en) * 2009-12-25 2010-04-28 株式会社日立国際電気 Semiconductor manufacturing apparatus, valve apparatus, CVD processing method using semiconductor manufacturing apparatus, and semiconductor manufacturing method
JP2010116627A (en) * 2009-12-25 2010-05-27 Hitachi Kokusai Electric Inc Semiconductor manufacturing equipment, valve device, cvd treatment method using the semiconductor manufacturing equipment, and method of manufacturing semiconductor
JP2010159492A (en) * 2009-12-25 2010-07-22 Hitachi Kokusai Electric Inc Semiconductor production apparatus and valve apparatus, and cvd processing method and method for producing semiconductor using the semiconductor production apparatus
JP4523071B2 (en) * 2009-12-25 2010-08-11 株式会社日立国際電気 Semiconductor manufacturing apparatus, valve apparatus, CVD processing method using semiconductor manufacturing apparatus, and semiconductor manufacturing method
JP2010189767A (en) * 2010-04-15 2010-09-02 Hitachi Kokusai Electric Inc Apparatus for manufacturing semiconductor, valve device, cvd treatment method using valve device, and method of manufacturing semiconductor

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