JPS5693192A - Diagnosis system - Google Patents

Diagnosis system

Info

Publication number
JPS5693192A
JPS5693192A JP16903679A JP16903679A JPS5693192A JP S5693192 A JPS5693192 A JP S5693192A JP 16903679 A JP16903679 A JP 16903679A JP 16903679 A JP16903679 A JP 16903679A JP S5693192 A JPS5693192 A JP S5693192A
Authority
JP
Japan
Prior art keywords
circuit
pass route
eccg
eccc
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16903679A
Other languages
Japanese (ja)
Other versions
JPS6329299B2 (en
Inventor
Ryushi Hiroya
Hiroki Masuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16903679A priority Critical patent/JPS5693192A/en
Publication of JPS5693192A publication Critical patent/JPS5693192A/en
Publication of JPS6329299B2 publication Critical patent/JPS6329299B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Detection And Correction Of Errors (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To realize a confirmation for the normalcy of each component circuit of a memory device and to indicate a faulty area clearly as well as reduce the repair time, by providing a by-pass route to a circuit forming the memory device.
CONSTITUTION: The by-pass route (p), switching P1 and P2 are provided to the error correction code generating circuit ECCG connected to the memory circuit M; the by-pass route (q), and switching gates Q1 and Q2 are provided to the data correction circuit ECCC. Setting of the dividing signals P and Q are done in the combination of 1 and 0 to confirm the performance for each of the circuit M, circuit ECCG and circuit ECCC.
COPYRIGHT: (C)1981,JPO&Japio
JP16903679A 1979-12-25 1979-12-25 Diagnosis system Granted JPS5693192A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16903679A JPS5693192A (en) 1979-12-25 1979-12-25 Diagnosis system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16903679A JPS5693192A (en) 1979-12-25 1979-12-25 Diagnosis system

Publications (2)

Publication Number Publication Date
JPS5693192A true JPS5693192A (en) 1981-07-28
JPS6329299B2 JPS6329299B2 (en) 1988-06-13

Family

ID=15879121

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16903679A Granted JPS5693192A (en) 1979-12-25 1979-12-25 Diagnosis system

Country Status (1)

Country Link
JP (1) JPS5693192A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6011952A (en) * 1983-07-01 1985-01-22 Mitsubishi Electric Corp Semiconductor memory device with error correcting means
JPS62156734A (en) * 1985-12-28 1987-07-11 Toshiba Corp Logic circuit
JPH01183741A (en) * 1988-01-18 1989-07-21 Fujitsu Ltd Diagnosis system for data processing circuit
JPH01201736A (en) * 1988-02-08 1989-08-14 Mitsubishi Electric Corp Microcomputer
JP2008198341A (en) * 2007-02-09 2008-08-28 Hynix Semiconductor Inc Data error measuring circuit for semiconductor memory

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02237304A (en) * 1989-03-10 1990-09-19 Matsushita Electric Ind Co Ltd Arithmetic unit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6011952A (en) * 1983-07-01 1985-01-22 Mitsubishi Electric Corp Semiconductor memory device with error correcting means
JPS62156734A (en) * 1985-12-28 1987-07-11 Toshiba Corp Logic circuit
JPH01183741A (en) * 1988-01-18 1989-07-21 Fujitsu Ltd Diagnosis system for data processing circuit
JPH01201736A (en) * 1988-02-08 1989-08-14 Mitsubishi Electric Corp Microcomputer
JP2008198341A (en) * 2007-02-09 2008-08-28 Hynix Semiconductor Inc Data error measuring circuit for semiconductor memory
US8370708B2 (en) 2007-02-09 2013-02-05 SK Hynix Inc. Data error measuring circuit for semiconductor memory apparatus

Also Published As

Publication number Publication date
JPS6329299B2 (en) 1988-06-13

Similar Documents

Publication Publication Date Title
JPS5693192A (en) Diagnosis system
JPS5332A (en) Memory redundance system
JPS5321542A (en) Error data memory circuit
JPS53114680A (en) Integrated circuit
JPS5431212A (en) Monitor circuit for digital signal transmission line
JPS51147206A (en) Data communication system employing photocoupler
JPS5326635A (en) Setting system for unit address
JPS52112245A (en) Data terminal unit
JPS5436147A (en) Control unit for microprogram
JPS5443434A (en) Diagnosis order deciding system
JPS5312241A (en) Buffer memory unit
JPS52123141A (en) Device control system
JPS5337A (en) Control system for input/output unit
JPS5315723A (en) Priority selection circuit
JPS53111255A (en) Check system for interface control signal
JPS538514A (en) Resending requesting unit for transmission error
JPS527618A (en) Satellite circuit quality monitoring system
JPS5315722A (en) Input/output interrupption control system
JPS52130261A (en) Scanning unit
JPS5384621A (en) Error resending system of picture signal
JPS5326631A (en) Logic circuit diagnosis system for main memory control uni t
JPS5314288A (en) Flux control system
JPS53120346A (en) Correction circuit for double error
JPS5311548A (en) Error information transfer control system
JPS5374806A (en) Error correction encoder