JPS567178A - Automatic pattern tester - Google Patents

Automatic pattern tester

Info

Publication number
JPS567178A
JPS567178A JP8236279A JP8236279A JPS567178A JP S567178 A JPS567178 A JP S567178A JP 8236279 A JP8236279 A JP 8236279A JP 8236279 A JP8236279 A JP 8236279A JP S567178 A JPS567178 A JP S567178A
Authority
JP
Japan
Prior art keywords
objective
detector
viewfield
turntable
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8236279A
Other languages
Japanese (ja)
Other versions
JPS6214874B2 (en
Inventor
Yuzaburo Mori
Toshihito Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daihen Corp
Original Assignee
Daihen Corp
Osaka Transformer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daihen Corp, Osaka Transformer Co Ltd filed Critical Daihen Corp
Priority to JP8236279A priority Critical patent/JPS567178A/en
Publication of JPS567178A publication Critical patent/JPS567178A/en
Publication of JPS6214874B2 publication Critical patent/JPS6214874B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To simplify the mechanism as well as facilitate the automation for the pattern tester, by supplying the pattern picture of the fixed position to the deciding unit at all times although the objective to be tested may be put in any direction on the turntable.
CONSTITUTION: The start signal is generated for the period during which the front edge of specified region 3 of the objective to be tested 2 on turntable 1 turns round the section of angle α ranging from the position which enters the viewfield of specified region detector 6 to the position which enters the viewfield of nonspecified region detector 7. In this connection, the pattern picture signal at the steady position on the objective 2 can always be supplied to the deciding unit by deciding the position of camera 4 based on the position of detector 6.
COPYRIGHT: (C)1981,JPO&Japio
JP8236279A 1979-06-29 1979-06-29 Automatic pattern tester Granted JPS567178A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8236279A JPS567178A (en) 1979-06-29 1979-06-29 Automatic pattern tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8236279A JPS567178A (en) 1979-06-29 1979-06-29 Automatic pattern tester

Publications (2)

Publication Number Publication Date
JPS567178A true JPS567178A (en) 1981-01-24
JPS6214874B2 JPS6214874B2 (en) 1987-04-04

Family

ID=13772461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8236279A Granted JPS567178A (en) 1979-06-29 1979-06-29 Automatic pattern tester

Country Status (1)

Country Link
JP (1) JPS567178A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60222980A (en) * 1984-03-12 1985-11-07 テキサス　インスツルメンツ　インコーポレイテツド Apparatus and method of automatically inspecting print label

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60222980A (en) * 1984-03-12 1985-11-07 テキサス　インスツルメンツ　インコーポレイテツド Apparatus and method of automatically inspecting print label

Also Published As

Publication number Publication date
JPS6214874B2 (en) 1987-04-04

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