JPS566168A - Supply mechanism for parts of semiconductor testing device - Google Patents

Supply mechanism for parts of semiconductor testing device

Info

Publication number
JPS566168A
JPS566168A JP8230879A JP8230879A JPS566168A JP S566168 A JPS566168 A JP S566168A JP 8230879 A JP8230879 A JP 8230879A JP 8230879 A JP8230879 A JP 8230879A JP S566168 A JPS566168 A JP S566168A
Authority
JP
Japan
Prior art keywords
parts
circuit
supply mechanism
output
delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8230879A
Other languages
Japanese (ja)
Inventor
Yuji Kamitaki
Shigeo Nishimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP8230879A priority Critical patent/JPS566168A/en
Publication of JPS566168A publication Critical patent/JPS566168A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To detect rapidly a parts supply mechanism getting jammed by giving an alarm according to the output of a timer circuit that receives the output of a delay circuit connected to a parts upper-limit detection part.
CONSTITUTION: In case that parts drop part 2 is jammed with parts, parts upper- limit detection part 3 generates a signal continuously and delay circuit 6 also generates a continuous signal with delay of a certain time. Setting the time of parts operation by timer circuit 8 changes the output signal of parts feeder driving circuit 7 to "L" through AND circuit 9 after the set time of timer circuit 8. Consequently, parts feeder 1 is disabled to operate and parts feeder drop part 2 can therefore be prevented from overflowing due to parts jamming. Simultaneously, alarm tone circuit 10 is put into operation.
COPYRIGHT: (C)1981,JPO&Japio
JP8230879A 1979-06-27 1979-06-27 Supply mechanism for parts of semiconductor testing device Pending JPS566168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8230879A JPS566168A (en) 1979-06-27 1979-06-27 Supply mechanism for parts of semiconductor testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8230879A JPS566168A (en) 1979-06-27 1979-06-27 Supply mechanism for parts of semiconductor testing device

Publications (1)

Publication Number Publication Date
JPS566168A true JPS566168A (en) 1981-01-22

Family

ID=13770920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8230879A Pending JPS566168A (en) 1979-06-27 1979-06-27 Supply mechanism for parts of semiconductor testing device

Country Status (1)

Country Link
JP (1) JPS566168A (en)

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