JPS5660367A - Trip time automatic test circuit dependent upon eddy current - Google Patents

Trip time automatic test circuit dependent upon eddy current

Info

Publication number
JPS5660367A
JPS5660367A JP13527179A JP13527179A JPS5660367A JP S5660367 A JPS5660367 A JP S5660367A JP 13527179 A JP13527179 A JP 13527179A JP 13527179 A JP13527179 A JP 13527179A JP S5660367 A JPS5660367 A JP S5660367A
Authority
JP
Japan
Prior art keywords
tested
trip time
contact
time
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13527179A
Other languages
Japanese (ja)
Inventor
Yusaku Matsubara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP13527179A priority Critical patent/JPS5660367A/en
Publication of JPS5660367A publication Critical patent/JPS5660367A/en
Pending legal-status Critical Current

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  • Emergency Protection Circuit Devices (AREA)

Abstract

PURPOSE: To reduce noise and vibration and suppress power loss and make a circuit small-size, by providing the current transformer of a high current ratio correspondingly to a material to be tested and by detecting the trip time when the primary-side contact for short-circuit and the voltage detecting circuit are operated simultaneously.
CONSTITUTION: At a test time, the contact of material 16 to be tested is closed previously, and constant-current device 11 is adjusted to flow a prescribed excessive current to material 16 to be tested. If material 16 to be tested is normal, the contact of material 16 to be tested is opened and the secondary-side voltage of current transformer 13 is increased rapidly after a prescribed time. This voltage is detected by detecting circuit 15 connected to the primary side of current transformer 13, and parallel contact 14 is closed, and the primary side is short-circuited. Consequently, the time for operating of detecting circuit 15 becomes the trip time.
COPYRIGHT: (C)1981,JPO&Japio
JP13527179A 1979-10-22 1979-10-22 Trip time automatic test circuit dependent upon eddy current Pending JPS5660367A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13527179A JPS5660367A (en) 1979-10-22 1979-10-22 Trip time automatic test circuit dependent upon eddy current

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13527179A JPS5660367A (en) 1979-10-22 1979-10-22 Trip time automatic test circuit dependent upon eddy current

Publications (1)

Publication Number Publication Date
JPS5660367A true JPS5660367A (en) 1981-05-25

Family

ID=15147793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13527179A Pending JPS5660367A (en) 1979-10-22 1979-10-22 Trip time automatic test circuit dependent upon eddy current

Country Status (1)

Country Link
JP (1) JPS5660367A (en)

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