JPS5655658Y2 - - Google Patents
Info
- Publication number
- JPS5655658Y2 JPS5655658Y2 JP1975092571U JP9257175U JPS5655658Y2 JP S5655658 Y2 JPS5655658 Y2 JP S5655658Y2 JP 1975092571 U JP1975092571 U JP 1975092571U JP 9257175 U JP9257175 U JP 9257175U JP S5655658 Y2 JPS5655658 Y2 JP S5655658Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1975092571U JPS5655658Y2 (en:Method) | 1975-07-02 | 1975-07-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1975092571U JPS5655658Y2 (en:Method) | 1975-07-02 | 1975-07-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS527568U JPS527568U (en:Method) | 1977-01-19 |
| JPS5655658Y2 true JPS5655658Y2 (en:Method) | 1981-12-25 |
Family
ID=28574491
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1975092571U Expired JPS5655658Y2 (en:Method) | 1975-07-02 | 1975-07-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5655658Y2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6152668B2 (ja) * | 2013-03-14 | 2017-06-28 | 株式会社ソシオネクスト | 半導体装置および半導体装置のテスト方法 |
-
1975
- 1975-07-02 JP JP1975092571U patent/JPS5655658Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS527568U (en:Method) | 1977-01-19 |