JPS56500046A - - Google Patents

Info

Publication number
JPS56500046A
JPS56500046A JP50050080A JP50050080A JPS56500046A JP S56500046 A JPS56500046 A JP S56500046A JP 50050080 A JP50050080 A JP 50050080A JP 50050080 A JP50050080 A JP 50050080A JP S56500046 A JPS56500046 A JP S56500046A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP50050080A
Other languages
Japanese (ja)
Other versions
JPH0544191B2 (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS56500046A publication Critical patent/JPS56500046A/ja
Publication of JPH0544191B2 publication Critical patent/JPH0544191B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B20/00Read-only memory [ROM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0149Manufacturing their interconnections or electrodes, e.g. source or drain electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • H10W20/01
    • H10W20/43

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Catalysts (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56500500A 1979-12-28 1980-10-15 Expired - Lifetime JPH0544191B2 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/108,289 US4319396A (en) 1979-12-28 1979-12-28 Method for fabricating IGFET integrated circuits

Publications (2)

Publication Number Publication Date
JPS56500046A true JPS56500046A (enExample) 1981-01-16
JPH0544191B2 JPH0544191B2 (enExample) 1993-07-05

Family

ID=22321345

Family Applications (2)

Application Number Title Priority Date Filing Date
JP81500500A Pending JPS56501586A (enExample) 1979-12-28 1980-10-15
JP56500500A Expired - Lifetime JPH0544191B2 (enExample) 1979-12-28 1980-10-15

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP81500500A Pending JPS56501586A (enExample) 1979-12-28 1980-10-15

Country Status (6)

Country Link
US (1) US4319396A (enExample)
EP (1) EP0042420B1 (enExample)
JP (2) JPS56501586A (enExample)
CA (1) CA1143072A (enExample)
DE (1) DE3072027D1 (enExample)
WO (1) WO1981001913A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5165086A (en) * 1985-02-20 1992-11-17 Hitachi, Ltd. Microprocessor chip using two-level metal lines technology
US4742019A (en) * 1985-10-30 1988-05-03 International Business Machines Corporation Method for forming aligned interconnections between logic stages
US5119313A (en) * 1987-08-04 1992-06-02 Texas Instruments Incorporated Comprehensive logic circuit layout system
JPH06314692A (ja) * 1993-04-27 1994-11-08 Intel Corp 集積回路におけるビア/接点被覆範囲を改善する方法
US5874754A (en) * 1993-07-01 1999-02-23 Lsi Logic Corporation Microelectronic cells with bent gates and compressed minimum spacings, and method of patterning interconnections for the gates
US5440154A (en) * 1993-07-01 1995-08-08 Lsi Logic Corporation Non-rectangular MOS device configurations for gate array type integrated circuits
US5358886A (en) * 1993-07-01 1994-10-25 Lsi Logic Corporation Method of making integrated circuit structure with programmable conductive electrode/interconnect material
EP0685881A1 (en) * 1994-05-31 1995-12-06 AT&T Corp. Linewidth control apparatus and method
US5696943A (en) * 1995-07-27 1997-12-09 Advanced Micro Devices, Inc. Method and apparatus for quick and reliable design modification on silicon
US6077308A (en) * 1997-08-21 2000-06-20 Micron Technology, Inc. Creating layout for integrated circuit structures
US6600341B2 (en) 2001-05-01 2003-07-29 Lattice Semiconductor Corp. Integrated circuit and associated design method using spare gate islands
US6814296B2 (en) 2001-05-01 2004-11-09 Lattice Semiconductor Corp. Integrated circuit and associated design method with antenna error control using spare gates
US7183623B2 (en) * 2001-10-02 2007-02-27 Agere Systems Inc. Trimmed integrated circuits with fuse circuits
US6747445B2 (en) 2001-10-31 2004-06-08 Agere Systems Inc. Stress migration test structure and method therefor
US6902957B2 (en) * 2003-05-05 2005-06-07 Faraday Technology Corp. Metal programmable integrated circuit capable of utilizing a plurality of clock sources and capable of eliminating clock skew
WO2008026284A1 (en) * 2006-08-31 2008-03-06 Fujitsu Limited Logic circuit

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3475621A (en) * 1967-03-23 1969-10-28 Ibm Standardized high-density integrated circuit arrangement and method
DE1762759B1 (de) * 1968-08-20 1970-08-20 Philips Patentverwaltung Monolithisch integrierte Schaltung zur Umsetzung einer Information aus einem Code in einen anderen
GB1357515A (en) * 1972-03-10 1974-06-26 Matsushita Electronics Corp Method for manufacturing an mos integrated circuit
US3747200A (en) * 1972-03-31 1973-07-24 Motorola Inc Integrated circuit fabrication method
FR2198267B1 (enExample) * 1972-06-30 1977-07-29 Ibm
JPS5947464B2 (ja) * 1974-09-11 1984-11-19 株式会社日立製作所 半導体装置
JPS51147982A (en) * 1975-06-13 1976-12-18 Nec Corp Integrated circuit
US4125854A (en) * 1976-12-02 1978-11-14 Mostek Corporation Symmetrical cell layout for static RAM
GB1575741A (en) * 1977-01-17 1980-09-24 Philips Electronic Associated Integrated circuits

Also Published As

Publication number Publication date
WO1981001913A1 (en) 1981-07-09
JPS56501586A (enExample) 1981-10-29
EP0042420A4 (en) 1984-11-22
JPH0544191B2 (enExample) 1993-07-05
EP0042420A1 (en) 1981-12-30
CA1143072A (en) 1983-03-15
EP0042420B1 (en) 1987-09-09
US4319396A (en) 1982-03-16
DE3072027D1 (en) 1987-10-15

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