JPS5649929A - Inspecting method for precision of radiation rate correcting circuit of radiation thermometer - Google Patents
Inspecting method for precision of radiation rate correcting circuit of radiation thermometerInfo
- Publication number
- JPS5649929A JPS5649929A JP12617279A JP12617279A JPS5649929A JP S5649929 A JPS5649929 A JP S5649929A JP 12617279 A JP12617279 A JP 12617279A JP 12617279 A JP12617279 A JP 12617279A JP S5649929 A JPS5649929 A JP S5649929A
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- rate
- transmitting
- furnace
- thermometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 title abstract 11
- 238000007689 inspection Methods 0.000 abstract 3
- 230000005540 biological transmission Effects 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
Abstract
PURPOSE:To enable simple inspection of the precision of the radistion-rate correcting circuit for an optional radiation rate of providing a blackbody furnace and a correcting plate which transmits the radiant rays from the blackbody furnace corresponding to the radiation rate of an object of inspection. CONSTITUTION:The radiation thermometer 2 having a radiation-rate correcting circuit 20 is installed so that its visual field fits correctly to the range of the cavity part 10 of the blackbody furnace 1. In the passage of rays between the furnace 1 and the object lens 21 of the thermometer 2 is provided a correcting plate 3 controlling the radiation energy from the furnace 1. In this correcting plate 3 are formed a plurality of transmitting windows 30 transmitting radiant rays with uniform density, and the trnasmission rate of transmitting parts turns to be ''1'', while the transmission rate of nontransmitting parts turns to be ''0''. The ratio of the total sum of the area of the above transmitting ports 30 to the total area of the surface of the correcting plate 3 is set so as to be equal in value to the radiation rate epsilon of an object of inspection. The radiation energy transmitted by the correcting plate 3 becomes equivalent to the radiation energy from the radiant body with the radiation rate epsilon at the absolute temperature T. Transmitting rays are applied to the thermometer 2, the temperature indicated at this time is compared with the absolute temperature T of the blackbody furnace 1, and thereby the precision of the circuit 20 at the radiation rate epsilon can be known.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12617279A JPS5649929A (en) | 1979-09-29 | 1979-09-29 | Inspecting method for precision of radiation rate correcting circuit of radiation thermometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12617279A JPS5649929A (en) | 1979-09-29 | 1979-09-29 | Inspecting method for precision of radiation rate correcting circuit of radiation thermometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5649929A true JPS5649929A (en) | 1981-05-06 |
Family
ID=14928454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12617279A Pending JPS5649929A (en) | 1979-09-29 | 1979-09-29 | Inspecting method for precision of radiation rate correcting circuit of radiation thermometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5649929A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5762419A (en) * | 1995-07-26 | 1998-06-09 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a thermal processing system |
US5938335A (en) * | 1996-04-08 | 1999-08-17 | Applied Materials, Inc. | Self-calibrating temperature probe |
US6086245A (en) * | 1995-07-26 | 2000-07-11 | Applied Materials, Inc. | Apparatus for infrared pyrometer calibration in a thermal processing system |
US6179465B1 (en) | 1996-03-28 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a thermal processing system using multiple light sources |
JP2015001388A (en) * | 2013-06-13 | 2015-01-05 | 独立行政法人産業技術総合研究所 | Calibration method of optical sensor |
-
1979
- 1979-09-29 JP JP12617279A patent/JPS5649929A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5762419A (en) * | 1995-07-26 | 1998-06-09 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a thermal processing system |
US6056433A (en) * | 1995-07-26 | 2000-05-02 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a thermal processing system |
US6086245A (en) * | 1995-07-26 | 2000-07-11 | Applied Materials, Inc. | Apparatus for infrared pyrometer calibration in a thermal processing system |
US6345909B1 (en) | 1995-07-26 | 2002-02-12 | Applied Materials, Inc. | Apparatus for infrared pyrometer calibration in a thermal processing system |
US6179465B1 (en) | 1996-03-28 | 2001-01-30 | Applied Materials, Inc. | Method and apparatus for infrared pyrometer calibration in a thermal processing system using multiple light sources |
KR100512191B1 (en) * | 1996-03-28 | 2005-10-21 | 어플라이드 머티어리얼스, 인코포레이티드 | Method and apparatus for calibrating a temperature probe in a thermal processing system |
US5938335A (en) * | 1996-04-08 | 1999-08-17 | Applied Materials, Inc. | Self-calibrating temperature probe |
JP2015001388A (en) * | 2013-06-13 | 2015-01-05 | 独立行政法人産業技術総合研究所 | Calibration method of optical sensor |
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