JPS5648519A - Level measuring device - Google Patents
Level measuring deviceInfo
- Publication number
- JPS5648519A JPS5648519A JP12506679A JP12506679A JPS5648519A JP S5648519 A JPS5648519 A JP S5648519A JP 12506679 A JP12506679 A JP 12506679A JP 12506679 A JP12506679 A JP 12506679A JP S5648519 A JPS5648519 A JP S5648519A
- Authority
- JP
- Japan
- Prior art keywords
- liquid
- transmission line
- inflection point
- level
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
Abstract
PURPOSE: To realize a high-accuracy measurement with no effect given from the density or other factors of the content object, by connecting the measuring electrode via the transmission line to the automatic measuring device which gives an automatic identification to the inflection point of the pulse reflecting signal at the impedance mismatching part of the transmission line.
CONSTITUTION: An automatic identification is given to the inflection point of the reflected signal of the pulse which is caused at the impedance mismatching part of the transmission line. Thus the level of the liquid or the like is measured by making use of the TDR automatic measuring device 6 which displays the impedance mismatching position through the inflection point. The lengths of the coaxial cable 5 and the measuring electrode 3 are set to L1 and L2 each, and the distance between the electrode tip and the liquid level is set to Lx respectively. Then the step pulse is applied to the coaxial cable by the device 6, and thus the Px is generated at the connector part 4 and the tip of the electrode in case no liquid is supplied. While the Px is generated at the P1 and the liquid interface in case the reflected pulses P1 and P2 are supplied. Accordingly, the reflected pulses P1 and Px are identified by setting previously the L1, L2, T1 and T2 each to the device 6. Thus the Tx is obtained and then the level Lx can be obtained from the Tx.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12506679A JPS5648519A (en) | 1979-09-28 | 1979-09-28 | Level measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12506679A JPS5648519A (en) | 1979-09-28 | 1979-09-28 | Level measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5648519A true JPS5648519A (en) | 1981-05-01 |
Family
ID=14900967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12506679A Pending JPS5648519A (en) | 1979-09-28 | 1979-09-28 | Level measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5648519A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015094759A (en) * | 2013-11-12 | 2015-05-18 | 桓達科技股▲フン▼有限公司 | Measuring apparatus for detecting level of material and temperature |
-
1979
- 1979-09-28 JP JP12506679A patent/JPS5648519A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015094759A (en) * | 2013-11-12 | 2015-05-18 | 桓達科技股▲フン▼有限公司 | Measuring apparatus for detecting level of material and temperature |
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