JPS5648009U - - Google Patents

Info

Publication number
JPS5648009U
JPS5648009U JP11741480U JP11741480U JPS5648009U JP S5648009 U JPS5648009 U JP S5648009U JP 11741480 U JP11741480 U JP 11741480U JP 11741480 U JP11741480 U JP 11741480U JP S5648009 U JPS5648009 U JP S5648009U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11741480U
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11741480U priority Critical patent/JPS5648009U/ja
Publication of JPS5648009U publication Critical patent/JPS5648009U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP11741480U 1980-08-21 1980-08-21 Pending JPS5648009U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11741480U JPS5648009U (ja) 1980-08-21 1980-08-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11741480U JPS5648009U (ja) 1980-08-21 1980-08-21

Publications (1)

Publication Number Publication Date
JPS5648009U true JPS5648009U (ja) 1981-04-28

Family

ID=29349624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11741480U Pending JPS5648009U (ja) 1980-08-21 1980-08-21

Country Status (1)

Country Link
JP (1) JPS5648009U (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000003142A (ja) * 1998-02-04 2000-01-07 Shimadzu Corp 電子線によるフラットパネルディスプレイのピクセル検査方法及び検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4318128Y1 (ja) * 1966-11-28 1968-07-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4318128Y1 (ja) * 1966-11-28 1968-07-26

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000003142A (ja) * 1998-02-04 2000-01-07 Shimadzu Corp 電子線によるフラットパネルディスプレイのピクセル検査方法及び検査装置

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