JPS564067A - Ic measuring apparatus - Google Patents

Ic measuring apparatus

Info

Publication number
JPS564067A
JPS564067A JP7929279A JP7929279A JPS564067A JP S564067 A JPS564067 A JP S564067A JP 7929279 A JP7929279 A JP 7929279A JP 7929279 A JP7929279 A JP 7929279A JP S564067 A JPS564067 A JP S564067A
Authority
JP
Japan
Prior art keywords
plate
packages
handle
turns
leg part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7929279A
Other languages
Japanese (ja)
Other versions
JPS5811585B2 (en
Inventor
Kinichi Nishikawa
Shotaro Kataoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Co Ltd
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Priority to JP54079292A priority Critical patent/JPS5811585B2/en
Publication of JPS564067A publication Critical patent/JPS564067A/en
Publication of JPS5811585B2 publication Critical patent/JPS5811585B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

PURPOSE: To reduce the time of the measurement and improve the exactness by feeding a number of IC package at a time to the measuring position after housed in the grooved tube by the rotary operation of the handle and they are allowed to drop after the measurement.
CONSTITUTION: As the handle 5 turns from the starting position to the measuring position, the roller 20 moves onto the top of the upper pawl piece 23 of the change- over element 22 and pushes the arc-shaped projection 12 of the switching plate 10 to incline the top of the plate 10 inward. Each elastic connection element 9 is pushed with the press element 11 and contacts the leg part f of IC packages at the tip. At the same time, the connecting rod 13 moves inward, causing the press element 14 to hold the top of the IC packages whereby the contact between the connection element and the leg part f is made more firm. When the handle 5 turns to the releasing position, the connection element 9 and the leg part f are separated. At the same time, the releasing plate 15 turns outward with the shaft 15' as the fulcrum to move the stopper 17 on the connection plate 16 whereby the IC packages slides down from the grooved tube 2.
COPYRIGHT: (C)1981,JPO&Japio
JP54079292A 1979-06-23 1979-06-23 IC measuring device Expired JPS5811585B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54079292A JPS5811585B2 (en) 1979-06-23 1979-06-23 IC measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54079292A JPS5811585B2 (en) 1979-06-23 1979-06-23 IC measuring device

Publications (2)

Publication Number Publication Date
JPS564067A true JPS564067A (en) 1981-01-16
JPS5811585B2 JPS5811585B2 (en) 1983-03-03

Family

ID=13685768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54079292A Expired JPS5811585B2 (en) 1979-06-23 1979-06-23 IC measuring device

Country Status (1)

Country Link
JP (1) JPS5811585B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0351510Y2 (en) * 1984-09-19 1991-11-05

Also Published As

Publication number Publication date
JPS5811585B2 (en) 1983-03-03

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