JPS564067A - Ic measuring apparatus - Google Patents
Ic measuring apparatusInfo
- Publication number
- JPS564067A JPS564067A JP7929279A JP7929279A JPS564067A JP S564067 A JPS564067 A JP S564067A JP 7929279 A JP7929279 A JP 7929279A JP 7929279 A JP7929279 A JP 7929279A JP S564067 A JPS564067 A JP S564067A
- Authority
- JP
- Japan
- Prior art keywords
- plate
- packages
- handle
- turns
- leg part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE: To reduce the time of the measurement and improve the exactness by feeding a number of IC package at a time to the measuring position after housed in the grooved tube by the rotary operation of the handle and they are allowed to drop after the measurement.
CONSTITUTION: As the handle 5 turns from the starting position to the measuring position, the roller 20 moves onto the top of the upper pawl piece 23 of the change- over element 22 and pushes the arc-shaped projection 12 of the switching plate 10 to incline the top of the plate 10 inward. Each elastic connection element 9 is pushed with the press element 11 and contacts the leg part f of IC packages at the tip. At the same time, the connecting rod 13 moves inward, causing the press element 14 to hold the top of the IC packages whereby the contact between the connection element and the leg part f is made more firm. When the handle 5 turns to the releasing position, the connection element 9 and the leg part f are separated. At the same time, the releasing plate 15 turns outward with the shaft 15' as the fulcrum to move the stopper 17 on the connection plate 16 whereby the IC packages slides down from the grooved tube 2.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54079292A JPS5811585B2 (en) | 1979-06-23 | 1979-06-23 | IC measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54079292A JPS5811585B2 (en) | 1979-06-23 | 1979-06-23 | IC measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS564067A true JPS564067A (en) | 1981-01-16 |
JPS5811585B2 JPS5811585B2 (en) | 1983-03-03 |
Family
ID=13685768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54079292A Expired JPS5811585B2 (en) | 1979-06-23 | 1979-06-23 | IC measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5811585B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0351510Y2 (en) * | 1984-09-19 | 1991-11-05 |
-
1979
- 1979-06-23 JP JP54079292A patent/JPS5811585B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5811585B2 (en) | 1983-03-03 |
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