JPS5640284A - Preparation of semiconductor heterojunction element - Google Patents

Preparation of semiconductor heterojunction element

Info

Publication number
JPS5640284A
JPS5640284A JP11590679A JP11590679A JPS5640284A JP S5640284 A JPS5640284 A JP S5640284A JP 11590679 A JP11590679 A JP 11590679A JP 11590679 A JP11590679 A JP 11590679A JP S5640284 A JPS5640284 A JP S5640284A
Authority
JP
Japan
Prior art keywords
substrate
amorphous
chamber
silicon
heterojunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11590679A
Other languages
Japanese (ja)
Inventor
Koshiro Mori
Shinichiro Ishihara
Tsuneo Tanaka
Seiichi Nagata
Shoichi Fukai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11590679A priority Critical patent/JPS5640284A/en
Priority to US06/132,406 priority patent/US4329699A/en
Publication of JPS5640284A publication Critical patent/JPS5640284A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Light Receiving Elements (AREA)

Abstract

PURPOSE:To permit the composition of a heterojunction between silicon and silicon carbide to be continuously changed when preparing an amorphous semiconductor heterojunction element, by using a silicon substrate as a target for sputtering and supplying a hydrocarbon gas. CONSTITUTION:A substrate 1 of such metal as Al or Mo, or Pt, which forms a potential barrier, or n type polycrystalline Si or n type monocrystalline Si, is coated with an amorphous Si layer 2, on which p type amorphous SiC is grown to form an amorphous heterojunction element having different forbidden band widths. For this, an electrode 6 on which a substrate 5 to be coated is mounted and an electrode 8 on which a Si substrate 7 to be a target are placed in a vacuum chamber 4 facing each other. After the inside of the chamber 4 is once made at 1-5X10<-6> Torr, an inert gas such as Ar and H2 or a hydrocarbon gas such as CH4 are supplied through a value 9, and a DC voltage is applied to the electrodes 6 and 8 to produce a plasma state in the chamber 4 for evaporation.
JP11590679A 1979-03-26 1979-09-10 Preparation of semiconductor heterojunction element Pending JPS5640284A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11590679A JPS5640284A (en) 1979-09-10 1979-09-10 Preparation of semiconductor heterojunction element
US06/132,406 US4329699A (en) 1979-03-26 1980-03-21 Semiconductor device and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11590679A JPS5640284A (en) 1979-09-10 1979-09-10 Preparation of semiconductor heterojunction element

Publications (1)

Publication Number Publication Date
JPS5640284A true JPS5640284A (en) 1981-04-16

Family

ID=14674127

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11590679A Pending JPS5640284A (en) 1979-03-26 1979-09-10 Preparation of semiconductor heterojunction element

Country Status (1)

Country Link
JP (1) JPS5640284A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167075A (en) * 1983-03-11 1984-09-20 Canon Inc Photosensor
JPS604273A (en) * 1983-06-22 1985-01-10 Toshiba Corp Photoelectric conversion member
JPS604274A (en) * 1983-06-22 1985-01-10 Toshiba Corp Photoelectric conversion member

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59167075A (en) * 1983-03-11 1984-09-20 Canon Inc Photosensor
JPS604273A (en) * 1983-06-22 1985-01-10 Toshiba Corp Photoelectric conversion member
JPS604274A (en) * 1983-06-22 1985-01-10 Toshiba Corp Photoelectric conversion member
JPH0473312B2 (en) * 1983-06-22 1992-11-20 Tokyo Shibaura Electric Co
JPH0473311B2 (en) * 1983-06-22 1992-11-20 Tokyo Shibaura Electric Co

Similar Documents

Publication Publication Date Title
US5747118A (en) Plasma enhanced chemical transport process for forming diamond films
Johnson et al. Hydrogen incorporation in silicon thin films deposited with a remote hydrogen plasma
Murayama et al. Structure of a silicon carbide film synthesized by rf reactive ion plating
JPS5640284A (en) Preparation of semiconductor heterojunction element
Mihama et al. Electron microscope study on the structure of gold films evaporated on sodium chloride, I. Influences of deposition rate and residual gas
Yokoyama et al. Low-temperature selective growth of GaAs by alternately supplying molecular beam epitaxy
Rübel et al. Characterization of reactively magnetron sputtered hydrogenated amorphous silicon films
Khan The Epitaxial Growth of Beta Silicon Carbide
Reinig et al. Crystalline silicon films grown by pulsed dc magnetron sputtering
JPH0558775A (en) Molecular-beam epitaxy device
Jachimowski et al. Recrystallization of InSb thin films obtained by cathode sputtering
JPS6320446A (en) Formation of boron nitride film
Wang et al. Effect of substrate bias on β-SiC films prepared by PECVD
JPS577116A (en) Manufacture of amorphous silicon thin film
JP2722726B2 (en) Method of coating diamond film
JP2522618B2 (en) Phosphorus alloyed cubic boron nitride film
JPH07130981A (en) Semiconductor electron emission element and its formation method
JPS5678413A (en) Preparation of amorphous silicon
JPH07161658A (en) Semiconductor substrate and its manufacture
Banerjee et al. Doping of RF-sputtered a-SiGe: H alloys
JPS55149192A (en) Manufacture of silicon carbide crystal layer
JPS61224417A (en) Manufacture of semiconductor device
Chayahara et al. Formation of Si-C films using negative ion beam sputtering
Kondratenko et al. On the Role of the Interphase Interaction for Metal Epitaxy on Alkali-Halide Substrates
JPS5670674A (en) Photoelectric converter