JPS563670Y2 - - Google Patents
Info
- Publication number
- JPS563670Y2 JPS563670Y2 JP15468275U JP15468275U JPS563670Y2 JP S563670 Y2 JPS563670 Y2 JP S563670Y2 JP 15468275 U JP15468275 U JP 15468275U JP 15468275 U JP15468275 U JP 15468275U JP S563670 Y2 JPS563670 Y2 JP S563670Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15468275U JPS563670Y2 (en:Method) | 1975-11-15 | 1975-11-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15468275U JPS563670Y2 (en:Method) | 1975-11-15 | 1975-11-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5268266U JPS5268266U (en:Method) | 1977-05-20 |
| JPS563670Y2 true JPS563670Y2 (en:Method) | 1981-01-27 |
Family
ID=28633912
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15468275U Expired JPS563670Y2 (en:Method) | 1975-11-15 | 1975-11-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS563670Y2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4676078B2 (ja) * | 2001-02-28 | 2011-04-27 | 日置電機株式会社 | 多芯ケーブル検査方法および多芯ケーブル検査装置 |
-
1975
- 1975-11-15 JP JP15468275U patent/JPS563670Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5268266U (en:Method) | 1977-05-20 |