JPS5623478U - - Google Patents
Info
- Publication number
- JPS5623478U JPS5623478U JP10563979U JP10563979U JPS5623478U JP S5623478 U JPS5623478 U JP S5623478U JP 10563979 U JP10563979 U JP 10563979U JP 10563979 U JP10563979 U JP 10563979U JP S5623478 U JPS5623478 U JP S5623478U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10563979U JPS5623478U (zh) | 1979-07-30 | 1979-07-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10563979U JPS5623478U (zh) | 1979-07-30 | 1979-07-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5623478U true JPS5623478U (zh) | 1981-03-03 |
Family
ID=29338297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10563979U Pending JPS5623478U (zh) | 1979-07-30 | 1979-07-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5623478U (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170016444A (ko) * | 2014-06-06 | 2017-02-13 | 루돌프 테크놀로지스 인코퍼레이티드 | 프로브 카드를 검사 장치로 측정하고 평가하는 방법 |
-
1979
- 1979-07-30 JP JP10563979U patent/JPS5623478U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170016444A (ko) * | 2014-06-06 | 2017-02-13 | 루돌프 테크놀로지스 인코퍼레이티드 | 프로브 카드를 검사 장치로 측정하고 평가하는 방법 |
| JP2017518493A (ja) * | 2014-06-06 | 2017-07-06 | ルドルフ・テクノロジーズ，インコーポレーテッド | 検査デバイスを用いてプローブカードを測定および評価する方法 |