JPS5617602B2 - - Google Patents
Info
- Publication number
- JPS5617602B2 JPS5617602B2 JP8134171A JP8134171A JPS5617602B2 JP S5617602 B2 JPS5617602 B2 JP S5617602B2 JP 8134171 A JP8134171 A JP 8134171A JP 8134171 A JP8134171 A JP 8134171A JP S5617602 B2 JPS5617602 B2 JP S5617602B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/165—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of a grating deformed by the object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8134171A JPS5617602B2 (ja) | 1971-10-16 | 1971-10-16 | |
| GB4756272A GB1364607A (en) | 1971-10-16 | 1972-10-16 | Method of measuring deformation |
| DE19722250679 DE2250679C3 (de) | 1971-10-16 | 1972-10-16 | Meßverfahren zur zerstörungsfreien Feststellung geringer Verformungen oder Formabweichungen eines Werkstücks und Anordnung zur Durchführung des Verfahrens |
| US05/567,286 US3985444A (en) | 1971-10-16 | 1974-09-19 | Highly sensitive process for measuring fine deformation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8134171A JPS5617602B2 (ja) | 1971-10-16 | 1971-10-16 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4847367A JPS4847367A (ja) | 1973-07-05 |
| JPS5617602B2 true JPS5617602B2 (ja) | 1981-04-23 |
Family
ID=13743653
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8134171A Expired JPS5617602B2 (ja) | 1971-10-16 | 1971-10-16 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS5617602B2 (ja) |
| DE (1) | DE2250679C3 (ja) |
| GB (1) | GB1364607A (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11085143B2 (en) | 2014-11-19 | 2021-08-10 | Samsung Electronics Co., Ltd. | Dryer |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4417872A1 (de) * | 1994-05-22 | 1995-11-23 | Robert Prof Dr Ing Massen | Optische Digitalisierung von Körperteilen |
| US7447558B2 (en) | 2004-09-18 | 2008-11-04 | The Ohio Willow Wood Company | Apparatus for determining a three dimensional shape of an object |
| WO2022074879A1 (ja) * | 2020-10-09 | 2022-04-14 | 株式会社島津製作所 | 材料試験機 |
| CN113758437B (zh) * | 2021-11-05 | 2022-03-18 | 北京创米智汇物联科技有限公司 | 一种非接触式变形监测系统和方法 |
-
1971
- 1971-10-16 JP JP8134171A patent/JPS5617602B2/ja not_active Expired
-
1972
- 1972-10-16 GB GB4756272A patent/GB1364607A/en not_active Expired
- 1972-10-16 DE DE19722250679 patent/DE2250679C3/de not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11085143B2 (en) | 2014-11-19 | 2021-08-10 | Samsung Electronics Co., Ltd. | Dryer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS4847367A (ja) | 1973-07-05 |
| GB1364607A (en) | 1974-08-21 |
| DE2250679C3 (de) | 1979-05-03 |
| DE2250679B2 (de) | 1978-08-24 |
| DE2250679A1 (de) | 1973-04-19 |