JPS56170770U - - Google Patents
Info
- Publication number
- JPS56170770U JPS56170770U JP6983180U JP6983180U JPS56170770U JP S56170770 U JPS56170770 U JP S56170770U JP 6983180 U JP6983180 U JP 6983180U JP 6983180 U JP6983180 U JP 6983180U JP S56170770 U JPS56170770 U JP S56170770U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6983180U JPS623733Y2 (ko) | 1980-05-21 | 1980-05-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6983180U JPS623733Y2 (ko) | 1980-05-21 | 1980-05-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56170770U true JPS56170770U (ko) | 1981-12-17 |
JPS623733Y2 JPS623733Y2 (ko) | 1987-01-28 |
Family
ID=29663710
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6983180U Expired JPS623733Y2 (ko) | 1980-05-21 | 1980-05-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS623733Y2 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100709356B1 (ko) | 2005-10-31 | 2007-04-20 | 주식회사 테스코 | 전기소자 검사용 멀티 프로브 기기 |
JP2007178143A (ja) * | 2005-12-27 | 2007-07-12 | Hioki Ee Corp | コンタクトプローブ装置および回路基板検査装置 |
-
1980
- 1980-05-21 JP JP6983180U patent/JPS623733Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100709356B1 (ko) | 2005-10-31 | 2007-04-20 | 주식회사 테스코 | 전기소자 검사용 멀티 프로브 기기 |
JP2007178143A (ja) * | 2005-12-27 | 2007-07-12 | Hioki Ee Corp | コンタクトプローブ装置および回路基板検査装置 |
JP4713332B2 (ja) * | 2005-12-27 | 2011-06-29 | 日置電機株式会社 | コンタクトプローブ装置および回路基板検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPS623733Y2 (ko) | 1987-01-28 |