JPS5616542B2 - - Google Patents
Info
- Publication number
- JPS5616542B2 JPS5616542B2 JP1236678A JP1236678A JPS5616542B2 JP S5616542 B2 JPS5616542 B2 JP S5616542B2 JP 1236678 A JP1236678 A JP 1236678A JP 1236678 A JP1236678 A JP 1236678A JP S5616542 B2 JPS5616542 B2 JP S5616542B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1236678A JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1236678A JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54105967A JPS54105967A (en) | 1979-08-20 |
JPS5616542B2 true JPS5616542B2 (enrdf_load_stackoverflow) | 1981-04-16 |
Family
ID=11803262
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1236678A Granted JPS54105967A (en) | 1978-02-08 | 1978-02-08 | Defect test system for pattern featuring directivity |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54105967A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3806209A1 (de) * | 1987-02-27 | 1988-09-08 | Mitsubishi Electric Corp | Strukturdefekt-erfassungssystem |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56117106A (en) * | 1980-02-20 | 1981-09-14 | Dainippon Printing Co Ltd | Inspecting device for pattern defect |
JPS572522A (en) * | 1980-06-05 | 1982-01-07 | Dainippon Printing Co Ltd | Defect inspecting device for regular pattern |
JPS58158921A (ja) * | 1982-03-16 | 1983-09-21 | Dainippon Printing Co Ltd | 規則性パタ−ンの欠陥検査装置 |
FR2706048B1 (fr) * | 1993-06-04 | 1995-08-04 | Marelli Autronica | Collimateur facilement contrôlable. |
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1978
- 1978-02-08 JP JP1236678A patent/JPS54105967A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3806209A1 (de) * | 1987-02-27 | 1988-09-08 | Mitsubishi Electric Corp | Strukturdefekt-erfassungssystem |
Also Published As
Publication number | Publication date |
---|---|
JPS54105967A (en) | 1979-08-20 |