JPS56138202A - Optical apparatus - Google Patents

Optical apparatus

Info

Publication number
JPS56138202A
JPS56138202A JP2323681A JP2323681A JPS56138202A JP S56138202 A JPS56138202 A JP S56138202A JP 2323681 A JP2323681 A JP 2323681A JP 2323681 A JP2323681 A JP 2323681A JP S56138202 A JPS56138202 A JP S56138202A
Authority
JP
Japan
Prior art keywords
cube corner
lambda
plate
uncoated
polarising
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2323681A
Other languages
English (en)
Other versions
JPH045922B2 (ja
Inventor
Debitsudo Garatsuto Jiyon
Jiyon Beitsu Uirufuretsudo
Ansonii Pureiyaa Maikeru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rank Organization Ltd
Original Assignee
Rank Organization Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rank Organization Ltd filed Critical Rank Organization Ltd
Publication of JPS56138202A publication Critical patent/JPS56138202A/ja
Publication of JPH045922B2 publication Critical patent/JPH045922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2323681A 1980-02-21 1981-02-20 Optical apparatus Granted JPS56138202A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8005947 1980-02-21

Publications (2)

Publication Number Publication Date
JPS56138202A true JPS56138202A (en) 1981-10-28
JPH045922B2 JPH045922B2 (ja) 1992-02-04

Family

ID=10511565

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2323681A Granted JPS56138202A (en) 1980-02-21 1981-02-20 Optical apparatus

Country Status (3)

Country Link
EP (1) EP0036251A3 (ja)
JP (1) JPS56138202A (ja)
GB (1) GB2070276B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58225301A (ja) * 1982-06-24 1983-12-27 Yokogawa Hokushin Electric Corp 光学式変位測定装置

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3404963C2 (de) * 1984-02-11 1986-09-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Laser-Interferometer zur Längenmessung
GB2203259A (en) * 1987-02-26 1988-10-12 Plessey Co Plc Polarisation rotator associated with reflective surface
GB2306654A (en) * 1995-10-31 1997-05-07 Rank Taylor Hobson Ltd Surface measuring apparatus
GB2389896B (en) * 2002-03-15 2005-10-12 Jolyon Defreitas Compact interferometer for measurement of angular displacement
US7009711B2 (en) 2002-04-11 2006-03-07 Zygo Corporation Retroreflector coating for an interferometer
US7382466B2 (en) 2002-04-11 2008-06-03 Zygo Corporation Coating for reflective optical components
US7327465B2 (en) 2003-06-19 2008-02-05 Zygo Corporation Compensation for effects of beam misalignments in interferometer metrology systems
US7286240B2 (en) 2003-06-19 2007-10-23 Zygo Corporation Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems
WO2005022078A1 (en) * 2003-08-27 2005-03-10 The University Of Queensland Method and apparatus for precision measurement of phase shifts
US7327466B2 (en) 2003-11-03 2008-02-05 Zygo Corporation Multi-corner retroreflector
US7298493B2 (en) 2004-06-30 2007-11-20 Zygo Corporation Interferometric optical assemblies and systems including interferometric optical assemblies
US7489407B2 (en) 2004-10-06 2009-02-10 Zygo Corporation Error correction in interferometry systems
WO2006102234A2 (en) 2005-03-18 2006-09-28 Zygo Corporation Multi-axis interferometer with procedure and data processing for mirror mapping
GB2429291B (en) 2005-08-18 2008-08-20 Taylor Hobson Ltd A metrological apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5147344A (ja) * 1974-10-21 1976-04-22 Hitachi Ltd

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1085350B (de) * 1957-07-02 1960-07-14 Leitz Ernst Gmbh Interferometer
GB1065226A (en) * 1964-06-01 1967-04-12 Kearney & Trecker Corp Length measuring instrument
FR1450299A (fr) * 1965-10-19 1966-05-06 Cutler Hammer Inc Systèmes interférométriques de jaugeage
US3434787A (en) * 1965-11-15 1969-03-25 Optomechanisms Inc Double axes interferometer
US3601490A (en) * 1966-12-30 1971-08-24 Keuffel & Esser Co Laser interferometer
DE2127483A1 (de) * 1971-06-03 1972-12-14 Leitz Ernst Gmbh Verfahren zur interferentiellen Messung von Langen, Winkeln, Gangunter schieden oder Geschwindigkeiten

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5147344A (ja) * 1974-10-21 1976-04-22 Hitachi Ltd

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58225301A (ja) * 1982-06-24 1983-12-27 Yokogawa Hokushin Electric Corp 光学式変位測定装置

Also Published As

Publication number Publication date
GB2070276A (en) 1981-09-03
EP0036251A2 (en) 1981-09-23
EP0036251A3 (en) 1986-02-05
JPH045922B2 (ja) 1992-02-04
GB2070276B (en) 1983-10-12

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