JPS56137242A - Measuring device for low-temperature distortion - Google Patents

Measuring device for low-temperature distortion

Info

Publication number
JPS56137242A
JPS56137242A JP4046180A JP4046180A JPS56137242A JP S56137242 A JPS56137242 A JP S56137242A JP 4046180 A JP4046180 A JP 4046180A JP 4046180 A JP4046180 A JP 4046180A JP S56137242 A JPS56137242 A JP S56137242A
Authority
JP
Japan
Prior art keywords
specimen
distortion
difference
low
sampling points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4046180A
Other languages
Japanese (ja)
Inventor
Tsutae Kobayashi
Akio Deguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP4046180A priority Critical patent/JPS56137242A/en
Publication of JPS56137242A publication Critical patent/JPS56137242A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means
    • G01N3/062—Special adaptations of indicating or recording means with mechanical indicating or recording means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/022—Environment of the test
    • G01N2203/0222—Temperature
    • G01N2203/0228—Low temperature; Cooling means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To prevent specimen from damage or thermal distortion by difference in material so as to make it possible to measure distortion accurately, by making a knife edge, which is to be made to contact an objective point of the specimen, with the same material as the specimen and in such as to form an obtuse angle on the tip section. CONSTITUTION:The knife edges 6 are made contact two sampling points of a specimen 2 of a soft organic material placed in a low-temperature tank 3, and the stretch between the two sampling points due to a load 5 applied by a tester is taken out of the low-temperature tank 3 through barlike members 8, and measurement is done by a differential transformer 7. An edge section on tip of the knife edge 6 is made of a soft organic material being the same material as the specimen 2, and the opening angle 9 is provided with a obtuse angle and also with a round shape. As thermal distortion occurring locally due to difference in thermal expansion rate between the edge section and the specimen is prevented in this way, and also because knotch effect due to difference in hardness between these two objects, it is possible to continue an accurate measurement of distortion of the specimen 2 until the last breaking stage.
JP4046180A 1980-03-31 1980-03-31 Measuring device for low-temperature distortion Pending JPS56137242A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4046180A JPS56137242A (en) 1980-03-31 1980-03-31 Measuring device for low-temperature distortion

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4046180A JPS56137242A (en) 1980-03-31 1980-03-31 Measuring device for low-temperature distortion

Publications (1)

Publication Number Publication Date
JPS56137242A true JPS56137242A (en) 1981-10-27

Family

ID=12581274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4046180A Pending JPS56137242A (en) 1980-03-31 1980-03-31 Measuring device for low-temperature distortion

Country Status (1)

Country Link
JP (1) JPS56137242A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59106049U (en) * 1982-12-29 1984-07-17 大阪瓦斯株式会社 Elongation measurement jig for low temperature tensile testing
JPS636311U (en) * 1986-06-26 1988-01-16

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59106049U (en) * 1982-12-29 1984-07-17 大阪瓦斯株式会社 Elongation measurement jig for low temperature tensile testing
JPS636311U (en) * 1986-06-26 1988-01-16

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