JPS56127773A - Etching device - Google Patents
Etching deviceInfo
- Publication number
- JPS56127773A JPS56127773A JP3036580A JP3036580A JPS56127773A JP S56127773 A JPS56127773 A JP S56127773A JP 3036580 A JP3036580 A JP 3036580A JP 3036580 A JP3036580 A JP 3036580A JP S56127773 A JPS56127773 A JP S56127773A
- Authority
- JP
- Japan
- Prior art keywords
- etching
- voltage
- current
- finish
- moment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
- Weting (AREA)
Abstract
PURPOSE:To form a groove at a high reproducibility by providing a finish-point detector which supplies a constant voltage or a constant current between a monitoring body and a counter electrode and detects the finish point of the etching as the moment when the monitoring body is removed by etching to cause a change in the voltage or current. CONSTITUTION:The counter electrode 21 and the monitoring body 22 are placed in an etching solution 23, DC voltage or DC current is supplied between the electrode 21 and the body 22 and is monitored by a voltmeter V or an ammeter A. In this case, the finish point of the etching is detected as the moment when the body 22 is removed by etching to cause an abrupt change in the voltage or the current.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3036580A JPS56127773A (en) | 1980-03-12 | 1980-03-12 | Etching device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3036580A JPS56127773A (en) | 1980-03-12 | 1980-03-12 | Etching device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56127773A true JPS56127773A (en) | 1981-10-06 |
Family
ID=12301832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3036580A Pending JPS56127773A (en) | 1980-03-12 | 1980-03-12 | Etching device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56127773A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58141531A (en) * | 1982-02-18 | 1983-08-22 | Toshiba Corp | Semiconductor element metal thin film etching apparatus |
-
1980
- 1980-03-12 JP JP3036580A patent/JPS56127773A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58141531A (en) * | 1982-02-18 | 1983-08-22 | Toshiba Corp | Semiconductor element metal thin film etching apparatus |
JPH0316776B2 (en) * | 1982-02-18 | 1991-03-06 | Tokyo Shibaura Electric Co |
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