JPS56122959U - - Google Patents
Info
- Publication number
- JPS56122959U JPS56122959U JP2178480U JP2178480U JPS56122959U JP S56122959 U JPS56122959 U JP S56122959U JP 2178480 U JP2178480 U JP 2178480U JP 2178480 U JP2178480 U JP 2178480U JP S56122959 U JPS56122959 U JP S56122959U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2178480U JPS56122959U (OSRAM) | 1980-02-20 | 1980-02-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2178480U JPS56122959U (OSRAM) | 1980-02-20 | 1980-02-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56122959U true JPS56122959U (OSRAM) | 1981-09-18 |
Family
ID=29617934
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2178480U Pending JPS56122959U (OSRAM) | 1980-02-20 | 1980-02-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56122959U (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010014479A (ja) * | 2008-07-02 | 2010-01-21 | Hioki Ee Corp | 測定装置および測定方法 |
| JP2010014603A (ja) * | 2008-07-04 | 2010-01-21 | Hioki Ee Corp | 測定装置および測定方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5258572A (en) * | 1975-11-10 | 1977-05-14 | Hitachi Ltd | High-accuracy measuring system |
-
1980
- 1980-02-20 JP JP2178480U patent/JPS56122959U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5258572A (en) * | 1975-11-10 | 1977-05-14 | Hitachi Ltd | High-accuracy measuring system |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010014479A (ja) * | 2008-07-02 | 2010-01-21 | Hioki Ee Corp | 測定装置および測定方法 |
| JP2010014603A (ja) * | 2008-07-04 | 2010-01-21 | Hioki Ee Corp | 測定装置および測定方法 |