JPS56122940A - Method and apparatus for detecting melting time point - Google Patents
Method and apparatus for detecting melting time pointInfo
- Publication number
- JPS56122940A JPS56122940A JP2748380A JP2748380A JPS56122940A JP S56122940 A JPS56122940 A JP S56122940A JP 2748380 A JP2748380 A JP 2748380A JP 2748380 A JP2748380 A JP 2748380A JP S56122940 A JPS56122940 A JP S56122940A
- Authority
- JP
- Japan
- Prior art keywords
- detecting
- point
- temperature
- output
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/02—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering
- G01N25/04—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering of melting point; of freezing point; of softening point
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To enable to easily perform an accurate detection by moving detecting point of surface temperature detector by infrared rays on the surface of contents in the crucible and detecting a point of time when the difference of temperature of the surface due to the presence of unmolten material is eliminated. CONSTITUTION:Detecting point of the surface temperature detector 3 by infrared rays is moved on the surface of the contents 2 in the crucible 1 and perfect melting time point is determined by time having no difference in the temperature of surface due to the presence of the unmolten material 2b. For example, the crucible 1 is rotated centering around the vertical axis 1' and the temperature of surface of the contents 2 is monitored in one circumference of a circle. Then, the output of the detector 3 and that of the holding circuit 5 holding a mean output in detecting time partitioned by the timing circuit 4 of the output of the detector 3, are compared by the comparator 6 and a decision output is outputted as the perfect melting time point when there is no difference between both outputs.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2748380A JPS56122940A (en) | 1980-03-04 | 1980-03-04 | Method and apparatus for detecting melting time point |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2748380A JPS56122940A (en) | 1980-03-04 | 1980-03-04 | Method and apparatus for detecting melting time point |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56122940A true JPS56122940A (en) | 1981-09-26 |
Family
ID=12222370
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2748380A Pending JPS56122940A (en) | 1980-03-04 | 1980-03-04 | Method and apparatus for detecting melting time point |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56122940A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04325488A (en) * | 1991-04-26 | 1992-11-13 | Mitsubishi Materials Corp | Method for controlling liquid surface temperature |
JP2018150219A (en) * | 2017-03-13 | 2018-09-27 | Ftb研究所株式会社 | Apparatus and method for growing large diameter cz single crystal |
GB2606141A (en) * | 2021-04-22 | 2022-11-02 | Stratasys Powder Production Ltd | Improved method, controller and apparatus for determining the onset of melting of a material |
-
1980
- 1980-03-04 JP JP2748380A patent/JPS56122940A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04325488A (en) * | 1991-04-26 | 1992-11-13 | Mitsubishi Materials Corp | Method for controlling liquid surface temperature |
JP2018150219A (en) * | 2017-03-13 | 2018-09-27 | Ftb研究所株式会社 | Apparatus and method for growing large diameter cz single crystal |
GB2606141A (en) * | 2021-04-22 | 2022-11-02 | Stratasys Powder Production Ltd | Improved method, controller and apparatus for determining the onset of melting of a material |
GB2606141B (en) * | 2021-04-22 | 2023-10-25 | Stratasys Powder Production Ltd | Improved method, controller and apparatus for determining the onset of melting of a material |
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