JPS56117175A - Screening device - Google Patents

Screening device

Info

Publication number
JPS56117175A
JPS56117175A JP2011880A JP2011880A JPS56117175A JP S56117175 A JPS56117175 A JP S56117175A JP 2011880 A JP2011880 A JP 2011880A JP 2011880 A JP2011880 A JP 2011880A JP S56117175 A JPS56117175 A JP S56117175A
Authority
JP
Japan
Prior art keywords
jig
slopes
magazine
angles
screening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011880A
Other languages
Japanese (ja)
Inventor
Shigenori Kinoshita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2011880A priority Critical patent/JPS56117175A/en
Publication of JPS56117175A publication Critical patent/JPS56117175A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To improve workability by accurately positioning products to the predetermined positions of a screening device by using the jigs having slopes to be applied on the angles of the outside shape of the products in semiconductor integrated circuit devices of flat package type. CONSTITUTION:When a small flat IC1 inserted in a magazine 6 comes to a take-out position 7, a position-correcting jig 9 having slopes 8 to be applied on the angles of the outside shape of the IC1 descends to stick the IC1. Thence, the jig 9 moves the IC1 to a screening part 10, places its leads on electrodes 11 and performs screening work. Hence, even if the position of the IC1 is deviating in the housing part of the magazine 6, the position may be corrected by the slopes 8 of the jig 9, and the IC1 may be stock always accurately to the center of the jig 9, whereby the workability is improved. It is also possible to prevent the electrostatic breakdown of the IC1 by making the magazine 6 conductive.
JP2011880A 1980-02-20 1980-02-20 Screening device Pending JPS56117175A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011880A JPS56117175A (en) 1980-02-20 1980-02-20 Screening device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011880A JPS56117175A (en) 1980-02-20 1980-02-20 Screening device

Publications (1)

Publication Number Publication Date
JPS56117175A true JPS56117175A (en) 1981-09-14

Family

ID=12018199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011880A Pending JPS56117175A (en) 1980-02-20 1980-02-20 Screening device

Country Status (1)

Country Link
JP (1) JPS56117175A (en)

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