JPS56110037A - Measuring device for luminous intensity - Google Patents

Measuring device for luminous intensity

Info

Publication number
JPS56110037A
JPS56110037A JP854481A JP854481A JPS56110037A JP S56110037 A JPS56110037 A JP S56110037A JP 854481 A JP854481 A JP 854481A JP 854481 A JP854481 A JP 854481A JP S56110037 A JPS56110037 A JP S56110037A
Authority
JP
Japan
Prior art keywords
measuring device
luminous intensity
luminous
intensity
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP854481A
Other languages
English (en)
Other versions
JPS6342735B2 (ja
Inventor
Bowado Jirubeeru
Bonnujiyan Kuroodo
Jiyatsuku Pere Jiyan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Publication of JPS56110037A publication Critical patent/JPS56110037A/ja
Publication of JPS6342735B2 publication Critical patent/JPS6342735B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP854481A 1980-01-23 1981-01-22 Measuring device for luminous intensity Granted JPS56110037A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8001408A FR2474166A1 (fr) 1980-01-23 1980-01-23 Dispositif de mesure photometrique pour solutions complexes a bruit de fond variable

Publications (2)

Publication Number Publication Date
JPS56110037A true JPS56110037A (en) 1981-09-01
JPS6342735B2 JPS6342735B2 (ja) 1988-08-25

Family

ID=9237787

Family Applications (1)

Application Number Title Priority Date Filing Date
JP854481A Granted JPS56110037A (en) 1980-01-23 1981-01-22 Measuring device for luminous intensity

Country Status (7)

Country Link
US (1) US4403861A (ja)
EP (2) EP0149859B1 (ja)
JP (1) JPS56110037A (ja)
CA (1) CA1158890A (ja)
DE (1) DE3174497D1 (ja)
ES (1) ES498687A0 (ja)
FR (1) FR2474166A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133054A (ja) * 2004-11-05 2006-05-25 Oki Electric Ind Co Ltd 干渉顔料検出装置
JP2006234681A (ja) * 2005-02-25 2006-09-07 National Institute Of Advanced Industrial & Technology 立体双楕円型光学装置
WO2018135130A1 (ja) * 2017-01-23 2018-07-26 アズビル株式会社 乾き度測定装置及び乾き度の測定方法
JP2021004856A (ja) * 2019-06-27 2021-01-14 三菱重工業株式会社 分光分析装置及び分光分析方法

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61108933A (ja) * 1984-11-01 1986-05-27 Power Reactor & Nuclear Fuel Dev Corp 遠隔操作型分光光度計
US4705349A (en) * 1985-01-18 1987-11-10 The United States Of America As Represented By The United States Department Of Energy Optical switch
US4987083A (en) * 1986-12-29 1991-01-22 Apple Glenn D Photometric analyzer and controller for beverages
JPH04501310A (ja) * 1988-04-13 1992-03-05 インターナショナル　インテグレイテッド　システムズ，インコーポレイテッド 流体検査および／または識別のシステム
US5002397A (en) * 1988-04-13 1991-03-26 International Integrated Systems, Inc. System of fluid inspection and/or identification
US5858769A (en) * 1989-05-15 1999-01-12 Akzo Nobel N.V. Device for detecting microorganisms
JPH0518896A (ja) * 1990-02-22 1993-01-26 Heinrich Hertz Inst Nachrichtentech Berlin Gmbh 小さな吸光量の検出用測定方法
US5056886A (en) * 1990-10-25 1991-10-15 Perkin-Elmer Corporation Optical switching device
US5077481A (en) * 1990-10-25 1991-12-31 The Perkin-Elmer Corporation Optical probe for measuring light transmission of liquid
DE4343872C2 (de) * 1993-12-22 1996-02-01 Hellma Gmbh U Co Kg Glastechni Vorrichtung mit einem Spektralphotometer und Lichtleitern
US5807750A (en) * 1995-05-02 1998-09-15 Air Instruments And Measurements, Inc. Optical substance analyzer and data processor
JP2002505866A (ja) * 1998-03-10 2002-02-26 ラージ・スケール・プローティオーミックス・コーポレイション 微生物の検出および特性付与
US6100528A (en) * 1999-01-19 2000-08-08 Wilt; Robert Analytical quantification and process control
US7251032B2 (en) * 2004-07-20 2007-07-31 Neptec Optical Solutions, Inc. Optical monitoring system with molecular filters
JP2008507730A (ja) * 2004-07-20 2008-03-13 ネプテック・オプティカル・ソリューションズ・インコーポレイテッド 回転光学スイッチ
US20060142650A1 (en) * 2004-07-20 2006-06-29 Prescient Medical, Inc. Systems and methods for medical interventional optical monitoring with molecular filters
WO2014144389A1 (en) * 2013-03-15 2014-09-18 Advantage Controls, Llc System and process for detecting phosphonate
FI20136173L (fi) * 2013-11-24 2015-05-25 Kemira Oyj Virran anionisen varauksen optinen määritys
CN109100314A (zh) * 2018-08-03 2018-12-28 江西怡杉科技有限公司 一种分光光度检测方法及装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3770354A (en) * 1970-07-04 1973-11-06 Yanagimoto Seisakusho Co Ltd Photoelectric photometer
JPS4914478U (ja) * 1972-05-12 1974-02-06
JPS548456U (ja) * 1977-06-20 1979-01-20

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582664A (en) * 1968-01-15 1971-06-01 Jiri Hrdina Compensated photoelectric measurement of fluids
DE1772676A1 (de) * 1968-06-19 1971-05-27 Le Sp K Bjuro Awtomatike W Nef Photometer
DE1939034C2 (de) * 1969-07-31 1971-01-28 Bio Cal Instr Gmbh Photometer zum Durchfuehren von Messungen bei unterschiedlichen Wellenlaengen
FR2106754A5 (ja) * 1970-09-23 1972-05-05 Commissariat Energie Atomique
DE2130331C3 (de) * 1971-06-18 1978-06-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Verfahren und Vorrichtung zur Bestimmung der Konzentrationen der Komponenten eines aus zwei Gasen und Rauch bestehenden Gemisches
SE355072B (ja) * 1972-03-24 1973-04-02 Lkb Produkter Ab
GB1421950A (en) * 1973-07-20 1976-01-21 Carves Simon Ltd Discharge from hoppers
JPS5128545A (ja) * 1974-09-04 1976-03-10 Kobe Steel Ltd Yosetsusochi
FR2317638A1 (fr) * 1975-07-09 1977-02-04 Commissariat Energie Atomique Dispositif d'analyse des constituants d'une solution par mesure photometrique
DE2620006A1 (de) * 1976-05-06 1977-11-17 Bbc Brown Boveri & Cie Photometer
US4088387A (en) * 1977-02-22 1978-05-09 The United States Of America As Represented By The Secretary Of The Navy Optical switch

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3770354A (en) * 1970-07-04 1973-11-06 Yanagimoto Seisakusho Co Ltd Photoelectric photometer
JPS4914478U (ja) * 1972-05-12 1974-02-06
JPS548456U (ja) * 1977-06-20 1979-01-20

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006133054A (ja) * 2004-11-05 2006-05-25 Oki Electric Ind Co Ltd 干渉顔料検出装置
JP2006234681A (ja) * 2005-02-25 2006-09-07 National Institute Of Advanced Industrial & Technology 立体双楕円型光学装置
JP4742616B2 (ja) * 2005-02-25 2011-08-10 独立行政法人産業技術総合研究所 立体双楕円型光学装置
WO2018135130A1 (ja) * 2017-01-23 2018-07-26 アズビル株式会社 乾き度測定装置及び乾き度の測定方法
JP2021004856A (ja) * 2019-06-27 2021-01-14 三菱重工業株式会社 分光分析装置及び分光分析方法

Also Published As

Publication number Publication date
ES8406724A1 (es) 1984-08-01
EP0033253A3 (en) 1982-05-05
DE3174497D1 (en) 1986-06-05
FR2474166A1 (fr) 1981-07-24
EP0033253B1 (fr) 1986-04-30
EP0033253A2 (fr) 1981-08-05
FR2474166B1 (ja) 1983-10-14
US4403861A (en) 1983-09-13
EP0149859A3 (en) 1985-10-30
EP0149859A2 (fr) 1985-07-31
JPS6342735B2 (ja) 1988-08-25
CA1158890A (en) 1983-12-20
ES498687A0 (es) 1984-08-01
EP0149859B1 (fr) 1988-12-28

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