JPS56103326A - Measured value catching device for object to be tested - Google Patents

Measured value catching device for object to be tested

Info

Publication number
JPS56103326A
JPS56103326A JP12703480A JP12703480A JPS56103326A JP S56103326 A JPS56103326 A JP S56103326A JP 12703480 A JP12703480 A JP 12703480A JP 12703480 A JP12703480 A JP 12703480A JP S56103326 A JPS56103326 A JP S56103326A
Authority
JP
Japan
Prior art keywords
tested
measured value
catching device
value catching
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12703480A
Other languages
English (en)
Other versions
JPH0152682B2 (ja
Inventor
Furitsuchie Rainaa
Deiitaa Yakobii Hansu
Shiyusutaa Eeritsuhi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ernst Leitz Wetzlar GmbH
Original Assignee
Ernst Leitz Wetzlar GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ernst Leitz Wetzlar GmbH filed Critical Ernst Leitz Wetzlar GmbH
Publication of JPS56103326A publication Critical patent/JPS56103326A/ja
Publication of JPH0152682B2 publication Critical patent/JPH0152682B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/093—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by photoelectric pick-up

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP12703480A 1979-09-15 1980-09-12 Measured value catching device for object to be tested Granted JPS56103326A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2937431A DE2937431C2 (de) 1979-09-15 1979-09-15 Einrichtung zur Meßwerterfassung an Prüflingen

Publications (2)

Publication Number Publication Date
JPS56103326A true JPS56103326A (en) 1981-08-18
JPH0152682B2 JPH0152682B2 (ja) 1989-11-09

Family

ID=6081008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12703480A Granted JPS56103326A (en) 1979-09-15 1980-09-12 Measured value catching device for object to be tested

Country Status (4)

Country Link
US (1) US4455755A (ja)
EP (1) EP0025485B1 (ja)
JP (1) JPS56103326A (ja)
DE (1) DE2937431C2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61131608U (ja) * 1985-02-06 1986-08-16
JP2019215340A (ja) * 2018-06-08 2019-12-19 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツングＤｒ． Ｊｏｈａｎｎｅｓ Ｈｅｉｄｅｎｈａｉｎ Ｇｅｓｅｌｌｓｃｈａｆｔ Ｍｉｔｂｅｓｃｈｒａｎｋｔｅｒ Ｈａｆｔｕｎｇ 位置測定装置および位置測定装置を作動する方法

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2045437B (en) * 1979-03-30 1984-02-08 Renishaw Electrical Ltd Coordinate measuring machine
DE2947394A1 (de) * 1979-11-24 1981-05-27 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Einrichtung zur messwerterfassung an prueflingen
DE3340311C2 (de) * 1983-11-08 1985-12-12 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Tast- und/oder Meßeinrichtung
DE3342403C2 (de) * 1983-11-24 1987-05-07 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Anordnung zum Erfassen der Lage und/oder der Abmessungen und/oder der Dreh- oder Winkellage von um eine Achse drehbaren Gegenständen bzw. deren Teilen oder Kanten von Zeigerinstrumenten
US4643622A (en) * 1984-04-26 1987-02-17 Moore Special Tool Co., Inc. Automatic C-axis feedrate control for machine tools
JPS6133845A (ja) * 1984-07-27 1986-02-17 Fanuc Ltd 任意方向倣い制御装置
GB8431746D0 (en) * 1984-12-17 1985-01-30 Renishaw Plc Contact-sensing probe
DE3527063C1 (de) * 1985-07-27 1986-01-30 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und Vorrichtung zum Schutz eines beweglichen,langgestreckten Maschinenteils
GB8605324D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Metrological apparatus
JP2647881B2 (ja) * 1986-09-03 1997-08-27 レニショウ パブリック リミテッド カンパニー 信号処理回路
GB8713715D0 (en) * 1987-06-11 1987-07-15 Renishaw Plc Workpiece inspection method
DE3725205A1 (de) * 1987-07-30 1989-02-09 Zeiss Carl Fa Tastkopf fuer koordinatenmessgeraete
DE3725207A1 (de) * 1987-07-30 1989-02-09 Zeiss Carl Fa Tastkopf fuer koordinatenmessgeraete
DE3801893A1 (de) * 1988-01-23 1989-02-16 Daimler Benz Ag Programmsteuerbares selbsttaetig messendes geraet
AU3283389A (en) * 1988-03-10 1989-10-05 Nawsir Inc. Contact sensing system
US4924715A (en) * 1988-03-10 1990-05-15 Nawsir Inc. Contact sensing system
DE3920716C1 (ja) * 1989-06-24 1990-11-29 Wild Leitz Gmbh, 6330 Wetzlar, De
DE4204602A1 (de) * 1992-02-15 1993-08-19 Zeiss Carl Fa Verfahren zur koordinatenmessung an werkstuecken
DE69323289T3 (de) * 1992-12-24 2003-04-24 Renishaw Plc, Wotton-Under-Edge Tastsonde und Signalverarbeitungsschaltung dafür
GB9305687D0 (en) * 1993-03-19 1993-05-05 Renishaw Metrology Ltd A signal processing for trigger probe
GB9415338D0 (en) * 1994-07-29 1994-09-21 Renishaw Plc Trigger probe circuit
DE19525592A1 (de) * 1995-07-13 1997-01-16 Zeiss Carl Fa Verfahren zur Koordinatenmessung an Werkstücken
US5832416A (en) * 1995-09-01 1998-11-03 Brown & Sharpe Manufacturing Company Calibration system for coordinate measuring machine
GB0308149D0 (en) * 2003-04-09 2003-05-14 Renishaw Plc Probe for sensing the position of an object
DE102015203369B4 (de) 2015-02-25 2020-02-20 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zum Bestimmen der Messbedingungen eines Rauheitssensors, Verfahren zum Vermessen der Rauheit einer Werkstückoberfläche, Computerprogrammprodukt sowie Messgerät eingerichtet zur Durchführung der Verfahren
DE102015209193A1 (de) * 2015-05-20 2016-11-24 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Erfassung dynamischer Schwingungen eines Rauheitssensors, Verfahren zur Vermessung der Rauheit einer Werkstückoberfläche, Computerprogrammprodukt sowie Messgerät eingerichtet zur Durchführung der Verfahren.
JP6788207B2 (ja) * 2019-04-16 2020-11-25 株式会社東京精密 変位検出器、表面性状測定機、及び真円度測定機

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51149050A (en) * 1975-05-13 1976-12-21 Rolls Royce Measuring device
JPS53117464A (en) * 1977-03-19 1978-10-13 Zeiss Stiftung Measuring head

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3164909A (en) * 1959-01-14 1965-01-12 Gen Electric Automatic gauging system
CH516789A (fr) * 1969-12-09 1971-12-15 D Assortiments Reunies Succurs Dispositif de transmission du mouvement d'un palpeur à un organe de lecture
GB1551217A (en) * 1975-05-13 1979-08-22 Renishaw Electrical Ltd Displacement measuring apparatus
FR2317631A1 (fr) * 1975-07-09 1977-02-04 Bendix Corp Procede et instrument pour determiner la distance entre deux points d'un objet
CH599534A5 (en) * 1975-10-23 1978-05-31 Tesa Sa Electrical feeler probe system
US4136458A (en) * 1976-10-01 1979-01-30 The Bendix Corporation Bi-axial probe
CH628137A5 (fr) * 1977-09-27 1982-02-15 Meseltron Sa Procede de mesure a l'aide d'une tete de mesure d'une machine a mesurer et tete de mesure pour la mise en oeuvre de ce procede.
GB2006435B (en) * 1977-10-22 1982-09-22 Renishaw Electrical Ltd Contact-sensing probe
FR2408813A1 (fr) * 1977-11-10 1979-06-08 Sagem Perfectionnements aux procedes et dispositifs de palpage a contact, notamment pour machines a mesurer
DE2820813A1 (de) * 1978-05-12 1979-11-15 Leitz Ernst Gmbh Verfahren und einrichtung zur messwerterfassung an prueflingen
DE2841548A1 (de) * 1978-09-23 1980-04-03 Leitz Ernst Gmbh Verfahren und einrichtung zur messwerterfassung an prueflingen

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51149050A (en) * 1975-05-13 1976-12-21 Rolls Royce Measuring device
JPS53117464A (en) * 1977-03-19 1978-10-13 Zeiss Stiftung Measuring head

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61131608U (ja) * 1985-02-06 1986-08-16
JP2019215340A (ja) * 2018-06-08 2019-12-19 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツングＤｒ． Ｊｏｈａｎｎｅｓ Ｈｅｉｄｅｎｈａｉｎ Ｇｅｓｅｌｌｓｃｈａｆｔ Ｍｉｔｂｅｓｃｈｒａｎｋｔｅｒ Ｈａｆｔｕｎｇ 位置測定装置および位置測定装置を作動する方法

Also Published As

Publication number Publication date
EP0025485B1 (de) 1983-09-07
US4455755A (en) 1984-06-26
DE2937431A1 (de) 1981-04-02
JPH0152682B2 (ja) 1989-11-09
DE2937431C2 (de) 1987-02-05
EP0025485A1 (de) 1981-03-25

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