JPS5610237A - Track element analyzer - Google Patents

Track element analyzer

Info

Publication number
JPS5610237A
JPS5610237A JP8486179A JP8486179A JPS5610237A JP S5610237 A JPS5610237 A JP S5610237A JP 8486179 A JP8486179 A JP 8486179A JP 8486179 A JP8486179 A JP 8486179A JP S5610237 A JPS5610237 A JP S5610237A
Authority
JP
Japan
Prior art keywords
ray
slab
characteristic
trace element
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8486179A
Other languages
Japanese (ja)
Inventor
Mitsuyoshi Sato
Hiroshi Ishijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP8486179A priority Critical patent/JPS5610237A/en
Publication of JPS5610237A publication Critical patent/JPS5610237A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To deterrmine a trace element stably by outputting a ratio of a characteristic X-ray strength of the trace element in a sample to a characteristic X-ray strength of a base metal element of the sample. CONSTITUTION:An electron beam 2 from an electron gun 1 is applied to a slab 3. X-ray from the slab 3 is incident to a spectroscope 5, a characteristic X-ray of a trace element in the slab 3 and a characteristic X-ray of a base metal element of a sample are determined spectroscopically, each being incident to detectors 9a, 9b. Outputs of the detectors 9a, 9b are inputted to counters 13a, 13b respectively by way of preamplifiers 10a, 10b, proportional amplifiers 11a, 11b and crest analyzers 12a, 12b. Outputs of the counters 13a, 13b are subjected to division on a divider 14. An output of the divider 14 represents a content of the trace element in the slab 3.
JP8486179A 1979-07-04 1979-07-04 Track element analyzer Pending JPS5610237A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8486179A JPS5610237A (en) 1979-07-04 1979-07-04 Track element analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8486179A JPS5610237A (en) 1979-07-04 1979-07-04 Track element analyzer

Publications (1)

Publication Number Publication Date
JPS5610237A true JPS5610237A (en) 1981-02-02

Family

ID=13842584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8486179A Pending JPS5610237A (en) 1979-07-04 1979-07-04 Track element analyzer

Country Status (1)

Country Link
JP (1) JPS5610237A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814039A (en) * 1981-07-17 1983-01-26 Seiko Instr & Electronics Ltd Electronic beam microanalyzer unit
JPS58167291A (en) * 1982-03-29 1983-10-03 Fujikura Rubber Ltd Swelling type life raft
JPS6397U (en) * 1986-06-19 1988-01-05

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830213U (en) * 1971-08-11 1973-04-13
JPS4998693A (en) * 1973-01-25 1974-09-18

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830213U (en) * 1971-08-11 1973-04-13
JPS4998693A (en) * 1973-01-25 1974-09-18

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5814039A (en) * 1981-07-17 1983-01-26 Seiko Instr & Electronics Ltd Electronic beam microanalyzer unit
JPH0332737B2 (en) * 1981-07-17 1991-05-14 Seikoo Denshi Kogyo Kk
JPS58167291A (en) * 1982-03-29 1983-10-03 Fujikura Rubber Ltd Swelling type life raft
JPS6397U (en) * 1986-06-19 1988-01-05
JPH0332475Y2 (en) * 1986-06-19 1991-07-10

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