JPS5575348U - - Google Patents
Info
- Publication number
- JPS5575348U JPS5575348U JP16031678U JP16031678U JPS5575348U JP S5575348 U JPS5575348 U JP S5575348U JP 16031678 U JP16031678 U JP 16031678U JP 16031678 U JP16031678 U JP 16031678U JP S5575348 U JPS5575348 U JP S5575348U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16031678U JPS5575348U (en) | 1978-11-20 | 1978-11-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16031678U JPS5575348U (en) | 1978-11-20 | 1978-11-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5575348U true JPS5575348U (en) | 1980-05-24 |
Family
ID=29153955
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16031678U Pending JPS5575348U (en) | 1978-11-20 | 1978-11-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5575348U (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8954902B2 (en) | 2005-07-11 | 2015-02-10 | Peregrine Semiconductor Corporation | Method and apparatus improving gate oxide reliability by controlling accumulated charge |
| US8994452B2 (en) | 2008-07-18 | 2015-03-31 | Peregrine Semiconductor Corporation | Low-noise high efficiency bias generation circuits and method |
| US9024700B2 (en) | 2008-02-28 | 2015-05-05 | Peregrine Semiconductor Corporation | Method and apparatus for use in digitally tuning a capacitor in an integrated circuit device |
| US9030248B2 (en) | 2008-07-18 | 2015-05-12 | Peregrine Semiconductor Corporation | Level shifter with output spike reduction |
| US9130564B2 (en) | 2005-07-11 | 2015-09-08 | Peregrine Semiconductor Corporation | Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink |
| US9177737B2 (en) | 2007-04-26 | 2015-11-03 | Peregrine Semiconductor Corporation | Tuning capacitance to enhance FET stack voltage withstand |
| US9190902B2 (en) | 2003-09-08 | 2015-11-17 | Peregrine Semiconductor Corporation | Low noise charge pump method and apparatus |
| US9264053B2 (en) | 2011-01-18 | 2016-02-16 | Peregrine Semiconductor Corporation | Variable frequency charge pump |
| US9369087B2 (en) | 2004-06-23 | 2016-06-14 | Peregrine Semiconductor Corporation | Integrated RF front end with stacked transistor switch |
| US9406695B2 (en) | 2013-11-20 | 2016-08-02 | Peregrine Semiconductor Corporation | Circuit and method for improving ESD tolerance and switching speed |
| US9590674B2 (en) | 2012-12-14 | 2017-03-07 | Peregrine Semiconductor Corporation | Semiconductor devices with switchable ground-body connection |
-
1978
- 1978-11-20 JP JP16031678U patent/JPS5575348U/ja active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9190902B2 (en) | 2003-09-08 | 2015-11-17 | Peregrine Semiconductor Corporation | Low noise charge pump method and apparatus |
| US9369087B2 (en) | 2004-06-23 | 2016-06-14 | Peregrine Semiconductor Corporation | Integrated RF front end with stacked transistor switch |
| US8954902B2 (en) | 2005-07-11 | 2015-02-10 | Peregrine Semiconductor Corporation | Method and apparatus improving gate oxide reliability by controlling accumulated charge |
| US9130564B2 (en) | 2005-07-11 | 2015-09-08 | Peregrine Semiconductor Corporation | Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink |
| US9177737B2 (en) | 2007-04-26 | 2015-11-03 | Peregrine Semiconductor Corporation | Tuning capacitance to enhance FET stack voltage withstand |
| US9293262B2 (en) | 2008-02-28 | 2016-03-22 | Peregrine Semiconductor Corporation | Digitally tuned capacitors with tapered and reconfigurable quality factors |
| US9024700B2 (en) | 2008-02-28 | 2015-05-05 | Peregrine Semiconductor Corporation | Method and apparatus for use in digitally tuning a capacitor in an integrated circuit device |
| US9106227B2 (en) | 2008-02-28 | 2015-08-11 | Peregrine Semiconductor Corporation | Devices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals |
| US9197194B2 (en) | 2008-02-28 | 2015-11-24 | Peregrine Semiconductor Corporation | Methods and apparatuses for use in tuning reactance in a circuit device |
| US9030248B2 (en) | 2008-07-18 | 2015-05-12 | Peregrine Semiconductor Corporation | Level shifter with output spike reduction |
| US8994452B2 (en) | 2008-07-18 | 2015-03-31 | Peregrine Semiconductor Corporation | Low-noise high efficiency bias generation circuits and method |
| US9264053B2 (en) | 2011-01-18 | 2016-02-16 | Peregrine Semiconductor Corporation | Variable frequency charge pump |
| US9413362B2 (en) | 2011-01-18 | 2016-08-09 | Peregrine Semiconductor Corporation | Differential charge pump |
| US9590674B2 (en) | 2012-12-14 | 2017-03-07 | Peregrine Semiconductor Corporation | Semiconductor devices with switchable ground-body connection |
| US9406695B2 (en) | 2013-11-20 | 2016-08-02 | Peregrine Semiconductor Corporation | Circuit and method for improving ESD tolerance and switching speed |