JPS5551307A - Pattern area measuring device - Google Patents
Pattern area measuring deviceInfo
- Publication number
- JPS5551307A JPS5551307A JP12557778A JP12557778A JPS5551307A JP S5551307 A JPS5551307 A JP S5551307A JP 12557778 A JP12557778 A JP 12557778A JP 12557778 A JP12557778 A JP 12557778A JP S5551307 A JPS5551307 A JP S5551307A
- Authority
- JP
- Japan
- Prior art keywords
- partial
- pattern
- pattern area
- area
- given
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Image Analysis (AREA)
Abstract
PURPOSE: To realize the area measurement for the pattern via a small-capacity memory device by attaching the labels to the runlength data obtained through the prescribed method and in the detection sequence of the partial patterns.
CONSTITUTION: The subject is scanned by quantization means 1, and 1 and 0 are given to the areas belonging and not belonging to the pattern part respectively. Then the runlength data is formed via partial connecting relation process means 5 based on a pair of data formed by position A which changes to 1 from 0 on a scanning row and position B changing to 0 from 1 after detection of A. At the same time, the labels are given to the data in the detection sequence of the partial patterns. Thus the connection relation is detected and memorized for the partial patterns. Then the counting is given every same labels via partial pattern area process means 7, and the partial pattern connection plus the area of the partial patterns connected with the partial pattern area are measured via pattern area process means 8. In such way, the pattern area can be measured by a small-capacity memory.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12557778A JPS5551307A (en) | 1978-10-11 | 1978-10-11 | Pattern area measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12557778A JPS5551307A (en) | 1978-10-11 | 1978-10-11 | Pattern area measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5551307A true JPS5551307A (en) | 1980-04-15 |
JPS6238643B2 JPS6238643B2 (en) | 1987-08-19 |
Family
ID=14913616
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12557778A Granted JPS5551307A (en) | 1978-10-11 | 1978-10-11 | Pattern area measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5551307A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60258689A (en) * | 1984-06-06 | 1985-12-20 | Matsushita Electric Ind Co Ltd | Image recognizing device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5296051A (en) * | 1976-02-06 | 1977-08-12 | Nec Corp | Area measuring system for patterns |
-
1978
- 1978-10-11 JP JP12557778A patent/JPS5551307A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5296051A (en) * | 1976-02-06 | 1977-08-12 | Nec Corp | Area measuring system for patterns |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60258689A (en) * | 1984-06-06 | 1985-12-20 | Matsushita Electric Ind Co Ltd | Image recognizing device |
Also Published As
Publication number | Publication date |
---|---|
JPS6238643B2 (en) | 1987-08-19 |
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