JPS5551307A - Pattern area measuring device - Google Patents

Pattern area measuring device

Info

Publication number
JPS5551307A
JPS5551307A JP12557778A JP12557778A JPS5551307A JP S5551307 A JPS5551307 A JP S5551307A JP 12557778 A JP12557778 A JP 12557778A JP 12557778 A JP12557778 A JP 12557778A JP S5551307 A JPS5551307 A JP S5551307A
Authority
JP
Japan
Prior art keywords
partial
pattern
pattern area
area
given
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12557778A
Other languages
Japanese (ja)
Other versions
JPS6238643B2 (en
Inventor
Hiroyuki Kami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP12557778A priority Critical patent/JPS5551307A/en
Publication of JPS5551307A publication Critical patent/JPS5551307A/en
Publication of JPS6238643B2 publication Critical patent/JPS6238643B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE: To realize the area measurement for the pattern via a small-capacity memory device by attaching the labels to the runlength data obtained through the prescribed method and in the detection sequence of the partial patterns.
CONSTITUTION: The subject is scanned by quantization means 1, and 1 and 0 are given to the areas belonging and not belonging to the pattern part respectively. Then the runlength data is formed via partial connecting relation process means 5 based on a pair of data formed by position A which changes to 1 from 0 on a scanning row and position B changing to 0 from 1 after detection of A. At the same time, the labels are given to the data in the detection sequence of the partial patterns. Thus the connection relation is detected and memorized for the partial patterns. Then the counting is given every same labels via partial pattern area process means 7, and the partial pattern connection plus the area of the partial patterns connected with the partial pattern area are measured via pattern area process means 8. In such way, the pattern area can be measured by a small-capacity memory.
COPYRIGHT: (C)1980,JPO&Japio
JP12557778A 1978-10-11 1978-10-11 Pattern area measuring device Granted JPS5551307A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12557778A JPS5551307A (en) 1978-10-11 1978-10-11 Pattern area measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12557778A JPS5551307A (en) 1978-10-11 1978-10-11 Pattern area measuring device

Publications (2)

Publication Number Publication Date
JPS5551307A true JPS5551307A (en) 1980-04-15
JPS6238643B2 JPS6238643B2 (en) 1987-08-19

Family

ID=14913616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12557778A Granted JPS5551307A (en) 1978-10-11 1978-10-11 Pattern area measuring device

Country Status (1)

Country Link
JP (1) JPS5551307A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60258689A (en) * 1984-06-06 1985-12-20 Matsushita Electric Ind Co Ltd Image recognizing device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5296051A (en) * 1976-02-06 1977-08-12 Nec Corp Area measuring system for patterns

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5296051A (en) * 1976-02-06 1977-08-12 Nec Corp Area measuring system for patterns

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60258689A (en) * 1984-06-06 1985-12-20 Matsushita Electric Ind Co Ltd Image recognizing device

Also Published As

Publication number Publication date
JPS6238643B2 (en) 1987-08-19

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