JPS52114355A - Apparatus for and method of analyzing image - Google Patents

Apparatus for and method of analyzing image

Info

Publication number
JPS52114355A
JPS52114355A JP3101476A JP3101476A JPS52114355A JP S52114355 A JPS52114355 A JP S52114355A JP 3101476 A JP3101476 A JP 3101476A JP 3101476 A JP3101476 A JP 3101476A JP S52114355 A JPS52114355 A JP S52114355A
Authority
JP
Japan
Prior art keywords
image
analyzing image
measured
elements
way
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3101476A
Other languages
Japanese (ja)
Other versions
JPS619563B2 (en
Inventor
Keisuke Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP3101476A priority Critical patent/JPS52114355A/en
Publication of JPS52114355A publication Critical patent/JPS52114355A/en
Publication of JPS619563B2 publication Critical patent/JPS619563B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: To provide an apparatus for and method of analyzing image, in which visual range to be measured is divided into a multiplicity of minute elements, and these elemnts are scanned by way of series of horizontal sweep, whereby area, length , etc. of the image, constituted by the combination of the above iminute image elements, can be measured in simple way.
COPYRIGHT: (C)1977,JPO&Japio
JP3101476A 1976-03-22 1976-03-22 Apparatus for and method of analyzing image Granted JPS52114355A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3101476A JPS52114355A (en) 1976-03-22 1976-03-22 Apparatus for and method of analyzing image

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3101476A JPS52114355A (en) 1976-03-22 1976-03-22 Apparatus for and method of analyzing image

Publications (2)

Publication Number Publication Date
JPS52114355A true JPS52114355A (en) 1977-09-26
JPS619563B2 JPS619563B2 (en) 1986-03-25

Family

ID=12319677

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3101476A Granted JPS52114355A (en) 1976-03-22 1976-03-22 Apparatus for and method of analyzing image

Country Status (1)

Country Link
JP (1) JPS52114355A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6361906A (en) * 1986-09-03 1988-03-18 Yaskawa Electric Mfg Co Ltd Detection system for position of center of gravity of object body by picture processor
JP6035375B1 (en) * 2015-06-02 2016-11-30 株式会社メック Defect inspection apparatus and defect inspection method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51120747A (en) * 1975-04-16 1976-10-22 Hitachi Ltd Device for inspecting line symmetrical patterns

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51120747A (en) * 1975-04-16 1976-10-22 Hitachi Ltd Device for inspecting line symmetrical patterns

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6361906A (en) * 1986-09-03 1988-03-18 Yaskawa Electric Mfg Co Ltd Detection system for position of center of gravity of object body by picture processor
JP6035375B1 (en) * 2015-06-02 2016-11-30 株式会社メック Defect inspection apparatus and defect inspection method

Also Published As

Publication number Publication date
JPS619563B2 (en) 1986-03-25

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