JPS5539349Y2 - - Google Patents
Info
- Publication number
- JPS5539349Y2 JPS5539349Y2 JP34875U JP34875U JPS5539349Y2 JP S5539349 Y2 JPS5539349 Y2 JP S5539349Y2 JP 34875 U JP34875 U JP 34875U JP 34875 U JP34875 U JP 34875U JP S5539349 Y2 JPS5539349 Y2 JP S5539349Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34875U JPS5539349Y2 (en:Method) | 1974-12-27 | 1974-12-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34875U JPS5539349Y2 (en:Method) | 1974-12-27 | 1974-12-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5184372U JPS5184372U (en:Method) | 1976-07-06 |
| JPS5539349Y2 true JPS5539349Y2 (en:Method) | 1980-09-13 |
Family
ID=34631205
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP34875U Expired JPS5539349Y2 (en:Method) | 1974-12-27 | 1974-12-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5539349Y2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59222774A (ja) * | 1983-06-02 | 1984-12-14 | Shin Nippon Denko Kk | 発光素子用試験装置 |
-
1974
- 1974-12-27 JP JP34875U patent/JPS5539349Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5184372U (en:Method) | 1976-07-06 |