JPS5528012B2 - - Google Patents
Info
- Publication number
- JPS5528012B2 JPS5528012B2 JP13470175A JP13470175A JPS5528012B2 JP S5528012 B2 JPS5528012 B2 JP S5528012B2 JP 13470175 A JP13470175 A JP 13470175A JP 13470175 A JP13470175 A JP 13470175A JP S5528012 B2 JPS5528012 B2 JP S5528012B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13470175A JPS5258984A (en) | 1975-11-11 | 1975-11-11 | Flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13470175A JPS5258984A (en) | 1975-11-11 | 1975-11-11 | Flaw detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5258984A JPS5258984A (en) | 1977-05-14 |
JPS5528012B2 true JPS5528012B2 (enrdf_load_stackoverflow) | 1980-07-24 |
Family
ID=15134564
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13470175A Granted JPS5258984A (en) | 1975-11-11 | 1975-11-11 | Flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5258984A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5789906U (enrdf_load_stackoverflow) * | 1980-11-21 | 1982-06-03 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5913079B2 (ja) * | 1976-06-08 | 1984-03-27 | 日立造船株式会社 | 複数の検出器を用いた多点検出法 |
JPS5657938A (en) * | 1979-10-17 | 1981-05-20 | Hitachi Ltd | Oversight detector for object to be inspected |
-
1975
- 1975-11-11 JP JP13470175A patent/JPS5258984A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5789906U (enrdf_load_stackoverflow) * | 1980-11-21 | 1982-06-03 |
Also Published As
Publication number | Publication date |
---|---|
JPS5258984A (en) | 1977-05-14 |