JPS5525788B2 - - Google Patents
Info
- Publication number
- JPS5525788B2 JPS5525788B2 JP10021075A JP10021075A JPS5525788B2 JP S5525788 B2 JPS5525788 B2 JP S5525788B2 JP 10021075 A JP10021075 A JP 10021075A JP 10021075 A JP10021075 A JP 10021075A JP S5525788 B2 JPS5525788 B2 JP S5525788B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10021075A JPS5224578A (en) | 1975-08-20 | 1975-08-20 | Surface defect detector |
| US05/715,218 US4095905A (en) | 1975-08-20 | 1976-08-17 | Surface-defect detecting device |
| GB34646/76A GB1548973A (en) | 1975-08-20 | 1976-08-19 | Surface defect detecting device |
| DE2637375A DE2637375C3 (de) | 1975-08-20 | 1976-08-19 | Optisches Oberflächenprüfgerät |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10021075A JPS5224578A (en) | 1975-08-20 | 1975-08-20 | Surface defect detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5224578A JPS5224578A (en) | 1977-02-24 |
| JPS5525788B2 true JPS5525788B2 (enExample) | 1980-07-08 |
Family
ID=14267929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10021075A Granted JPS5224578A (en) | 1975-08-20 | 1975-08-20 | Surface defect detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5224578A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS545764A (en) * | 1977-06-15 | 1979-01-17 | Showa Electric Wire & Cable Co | Device of detecting deformed condition of filament body |
| JPS6210680Y2 (enExample) * | 1979-04-09 | 1987-03-13 | ||
| JPH0886623A (ja) * | 1994-09-19 | 1996-04-02 | Nec Corp | 溝形状測定装置 |
-
1975
- 1975-08-20 JP JP10021075A patent/JPS5224578A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5224578A (en) | 1977-02-24 |