JPS5523510B2 - - Google Patents
Info
- Publication number
- JPS5523510B2 JPS5523510B2 JP9254873A JP9254873A JPS5523510B2 JP S5523510 B2 JPS5523510 B2 JP S5523510B2 JP 9254873 A JP9254873 A JP 9254873A JP 9254873 A JP9254873 A JP 9254873A JP S5523510 B2 JPS5523510 B2 JP S5523510B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Details Of Television Scanning (AREA)
- Radar Systems Or Details Thereof (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9254873A JPS5523510B2 (https=) | 1973-08-20 | 1973-08-20 | |
| NL7411128A NL7411128A (en) | 1973-08-20 | 1974-08-20 | Electron beam tube arrangement - is for vertical deflection response control in industrial TV or electron microscope systems |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9254873A JPS5523510B2 (https=) | 1973-08-20 | 1973-08-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5042720A JPS5042720A (https=) | 1975-04-18 |
| JPS5523510B2 true JPS5523510B2 (https=) | 1980-06-23 |
Family
ID=14057437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9254873A Expired JPS5523510B2 (https=) | 1973-08-20 | 1973-08-20 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS5523510B2 (https=) |
| NL (1) | NL7411128A (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2534586C3 (de) * | 1975-08-02 | 1979-03-29 | Pusch, Guenter, Dr.-Ing., 6903 Neckargemuend | Verfahren und Einrichtung zur Abtastung und zur elektronischen Verarbeitung thermischer Bilder |
| JP6719000B2 (ja) * | 2019-02-19 | 2020-07-08 | 日本電子株式会社 | 電子顕微鏡および電子顕微鏡の作動方法 |
-
1973
- 1973-08-20 JP JP9254873A patent/JPS5523510B2/ja not_active Expired
-
1974
- 1974-08-20 NL NL7411128A patent/NL7411128A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| NL7411128A (en) | 1975-02-24 |
| JPS5042720A (https=) | 1975-04-18 |