JPS5519722A - Corpuscular ray microanalyzer - Google Patents

Corpuscular ray microanalyzer

Info

Publication number
JPS5519722A
JPS5519722A JP9187278A JP9187278A JPS5519722A JP S5519722 A JPS5519722 A JP S5519722A JP 9187278 A JP9187278 A JP 9187278A JP 9187278 A JP9187278 A JP 9187278A JP S5519722 A JPS5519722 A JP S5519722A
Authority
JP
Japan
Prior art keywords
light
light source
imaging
objective lens
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9187278A
Other languages
Japanese (ja)
Other versions
JPS5856954B2 (en
Inventor
Susumu Takashima
Toshiaki Miyokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP9187278A priority Critical patent/JPS5856954B2/en
Publication of JPS5519722A publication Critical patent/JPS5519722A/en
Publication of JPS5856954B2 publication Critical patent/JPS5856954B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

PURPOSE: To enhance a precision of utilization of the optical system, with an overlapping of flare eliminated to the sample image and the contrast improved, by means of arranging an installation of opaque substance, for limiting an incident light to the hole of objective lens, to an appropriate place on optical axis of the optical microscope.
CONSTITUTION: With metals of Al, Cr, etc. evaporated on a transparent glass plate so as to shut out a light beam passing through electron beam hole of an objective lens 13, is constructed the evaporation portion 17 of a shielding plate 16, which is provided in the position of a first light source image A. Accordingly, an imaging, made by a condenser lens 6, of the light, as shown by dotted line in the drawing, from the center portion of a light source 5, is cut by the evaporation portion 17 of the shielding plate 16, and the first light source image A, made by a light of full line as shown in the drawing, from the portion other than the center part of the light source 5, generates a second light source image B through a projection lesn 7, with its light passing through the portion other than the objective lens 13 hole to be irradiated to a sample 4. Further with its reflecting light passing through an eye lens 12 in the reverse route, the imaging is made in the eyeball retina. In this way, an overlapping of unnecessary light, causing a flare to the imaging in the retina, can be prevented.
COPYRIGHT: (C)1980,JPO&Japio
JP9187278A 1978-07-27 1978-07-27 Particle beam microanalyzer Expired JPS5856954B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9187278A JPS5856954B2 (en) 1978-07-27 1978-07-27 Particle beam microanalyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9187278A JPS5856954B2 (en) 1978-07-27 1978-07-27 Particle beam microanalyzer

Publications (2)

Publication Number Publication Date
JPS5519722A true JPS5519722A (en) 1980-02-12
JPS5856954B2 JPS5856954B2 (en) 1983-12-17

Family

ID=14038642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9187278A Expired JPS5856954B2 (en) 1978-07-27 1978-07-27 Particle beam microanalyzer

Country Status (1)

Country Link
JP (1) JPS5856954B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS628437A (en) * 1985-07-04 1987-01-16 Jeol Ltd Particle beam micro-analyzer
JPS6241660U (en) * 1985-07-25 1987-03-12
JPS62167210U (en) * 1986-04-11 1987-10-23
JPH01304648A (en) * 1988-06-01 1989-12-08 Hitachi Ltd Convergence ion beam processor
TWI565861B (en) * 2016-01-14 2017-01-11 臺灣塑膠工業股份有限公司 Multilayer well casing

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60253856A (en) * 1984-05-30 1985-12-14 Fujitsu Ltd Method for monitoring contamination of furnance core tube

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS628437A (en) * 1985-07-04 1987-01-16 Jeol Ltd Particle beam micro-analyzer
JPS6241660U (en) * 1985-07-25 1987-03-12
JPS62167210U (en) * 1986-04-11 1987-10-23
JPH01304648A (en) * 1988-06-01 1989-12-08 Hitachi Ltd Convergence ion beam processor
TWI565861B (en) * 2016-01-14 2017-01-11 臺灣塑膠工業股份有限公司 Multilayer well casing

Also Published As

Publication number Publication date
JPS5856954B2 (en) 1983-12-17

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