JPS55149831A - Defect detector for semitransparent article - Google Patents

Defect detector for semitransparent article

Info

Publication number
JPS55149831A
JPS55149831A JP2262380A JP2262380A JPS55149831A JP S55149831 A JPS55149831 A JP S55149831A JP 2262380 A JP2262380 A JP 2262380A JP 2262380 A JP2262380 A JP 2262380A JP S55149831 A JPS55149831 A JP S55149831A
Authority
JP
Japan
Prior art keywords
semitransparent
article
defect detector
defect
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2262380A
Other languages
English (en)
Other versions
JPH0219898B2 (ja
Inventor
Taireeru Andoru
Okonaa Burendan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Societe Generale pour lEmballage
UDARAS NA GAELTACHTA
Original Assignee
Societe Generale pour lEmballage
UDARAS NA GAELTACHTA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe Generale pour lEmballage, UDARAS NA GAELTACHTA filed Critical Societe Generale pour lEmballage
Publication of JPS55149831A publication Critical patent/JPS55149831A/ja
Publication of JPH0219898B2 publication Critical patent/JPH0219898B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9045—Inspection of ornamented or stippled container walls

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2262380A 1979-02-26 1980-02-25 Defect detector for semitransparent article Granted JPS55149831A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IE320/79A IE47919B1 (en) 1979-02-26 1979-02-26 Apparatus for inspecting translucent articles for faults

Publications (2)

Publication Number Publication Date
JPS55149831A true JPS55149831A (en) 1980-11-21
JPH0219898B2 JPH0219898B2 (ja) 1990-05-07

Family

ID=11010421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2262380A Granted JPS55149831A (en) 1979-02-26 1980-02-25 Defect detector for semitransparent article

Country Status (16)

Country Link
US (1) US4338028A (ja)
EP (1) EP0016551B1 (ja)
JP (1) JPS55149831A (ja)
AR (1) AR224636A1 (ja)
AT (1) ATE3591T1 (ja)
AU (1) AU5586980A (ja)
BR (1) BR8001110A (ja)
CA (1) CA1139862A (ja)
DE (1) DE3063412D1 (ja)
DK (1) DK154668C (ja)
ES (1) ES8106804A1 (ja)
IE (1) IE47919B1 (ja)
MX (1) MX149115A (ja)
NO (1) NO800512L (ja)
NZ (1) NZ192965A (ja)
ZA (1) ZA801050B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5899738A (ja) * 1981-12-09 1983-06-14 Yamamura Glass Kk 透明体の欠陥検出装置

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492476A (en) * 1981-02-20 1985-01-08 Kirin Beer Kabushiki Kaisha Defect detecting method and apparatus
US4584469A (en) * 1982-12-30 1986-04-22 Owens-Illinois, Inc. Optical detection of radial reflective defects
US4655349A (en) * 1984-12-27 1987-04-07 Brockway, Inc. System for automatically inspecting transparent containers for sidewall and dimensional defects
ZA875450B (en) * 1986-07-28 1988-04-27 Saint Gobain Cinematique Inspection of transparent bodies
US4791287A (en) * 1987-11-27 1988-12-13 American Glass Research, Inc. Apparatus and an associated method for detecting haze or pearlescence in containers
WO1990002937A1 (en) * 1988-09-16 1990-03-22 Owens-Illinois Glass Container Inc. Inspection of container finish
JPH0458100A (ja) * 1990-06-27 1992-02-25 Matsushita Electric Ind Co Ltd 多翼遠心ファン
US7781723B1 (en) 1998-02-19 2010-08-24 Emhart Glass S.A. Container inspection machine using light source having spatially cyclically continuously varying intensity
DE10017126C1 (de) * 2000-04-06 2001-06-13 Krones Ag Verfahren und Vorrichtung zum optischen Überprüfen transparenter Behälter
FR2818442B1 (fr) * 2000-12-20 2003-10-17 Energy Systems Internat Bv Dispositif photovoltaique formant vitrage
JP2004516631A (ja) * 2000-12-22 2004-06-03 フェイ カンパニ 特に半導体ウェーハ用の粒子光学検査装置
US7701570B2 (en) * 2005-12-12 2010-04-20 Corning Incorporated Collimated light method and system for detecting defects in honeycombs
US9670809B2 (en) 2011-11-29 2017-06-06 Corning Incorporated Apparatus and method for skinning articles
US10611051B2 (en) 2013-10-15 2020-04-07 Corning Incorporated Systems and methods for skinning articles
US9239296B2 (en) * 2014-03-18 2016-01-19 Corning Incorporated Skinning of ceramic honeycomb bodies
CN117491391B (zh) * 2023-12-29 2024-03-15 登景(天津)科技有限公司 基于芯片计算的玻璃基板光三维健康检测方法及设备

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830484A (ja) * 1971-08-24 1973-04-21
JPS5319896A (en) * 1976-08-06 1978-02-23 Nec Corp Detecting apparatus of magnetic body

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1061298A (en) * 1963-10-21 1967-03-08 Owens Illinois Inc Improvements in and relating to the detection of defects in transparent or translucent containers
GB1147838A (en) * 1966-04-23 1969-04-10 Gerresheimer Glashuettenwerke Process and device for testing glass bodies by optical means for undesired occlusions, dirt and folds in the glass
GB1207489A (en) * 1966-12-06 1970-10-07 North Atlantic Res Products Lt A system for detecting surface flaws in objects
US3529169A (en) * 1967-12-06 1970-09-15 Fmc Corp Photoelectric apparatus for detecting shape of bottles
US3577039A (en) * 1969-01-28 1971-05-04 Bendix Corp Optical apparatus for flaw detection
US3618063A (en) * 1970-02-11 1971-11-02 Eastman Kodak Co Defect inspection apparatus
US3729619A (en) * 1971-03-04 1973-04-24 Steel Corp Apparatus for surface inspection of moving material with defect type recognition
AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
US3987301A (en) * 1973-06-27 1976-10-19 Talcoma Teoranta Light collection apparatus
US3886356A (en) * 1973-09-10 1975-05-27 Inex Inc Optical inspection apparatus
US4165939A (en) * 1975-01-22 1979-08-28 Tsn Company, Inc. Apparatus for inspection and dimensional measurement by sequential reading

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830484A (ja) * 1971-08-24 1973-04-21
JPS5319896A (en) * 1976-08-06 1978-02-23 Nec Corp Detecting apparatus of magnetic body

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5899738A (ja) * 1981-12-09 1983-06-14 Yamamura Glass Kk 透明体の欠陥検出装置
JPH043498B2 (ja) * 1981-12-09 1992-01-23

Also Published As

Publication number Publication date
DK80180A (da) 1980-08-27
DK154668C (da) 1989-05-01
ZA801050B (en) 1981-08-26
NO800512L (no) 1980-08-27
ATE3591T1 (de) 1983-06-15
CA1139862A (en) 1983-01-18
EP0016551A1 (en) 1980-10-01
IE47919B1 (en) 1984-07-25
DE3063412D1 (en) 1983-07-07
AU5586980A (en) 1980-09-04
JPH0219898B2 (ja) 1990-05-07
DK154668B (da) 1988-12-05
MX149115A (es) 1983-08-26
BR8001110A (pt) 1980-10-29
ES488735A0 (es) 1981-09-01
US4338028A (en) 1982-07-06
IE790320L (en) 1980-08-26
NZ192965A (en) 1983-03-15
ES8106804A1 (es) 1981-09-01
EP0016551B1 (en) 1983-05-25
AR224636A1 (es) 1981-12-30

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