JPS55113979U - - Google Patents
Info
- Publication number
- JPS55113979U JPS55113979U JP1408379U JP1408379U JPS55113979U JP S55113979 U JPS55113979 U JP S55113979U JP 1408379 U JP1408379 U JP 1408379U JP 1408379 U JP1408379 U JP 1408379U JP S55113979 U JPS55113979 U JP S55113979U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1408379U JPS55113979U (enExample) | 1979-02-05 | 1979-02-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1408379U JPS55113979U (enExample) | 1979-02-05 | 1979-02-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS55113979U true JPS55113979U (enExample) | 1980-08-11 |
Family
ID=28833347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1408379U Pending JPS55113979U (enExample) | 1979-02-05 | 1979-02-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55113979U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015072128A (ja) * | 2013-10-01 | 2015-04-16 | 三菱電機株式会社 | 半導体装置の検査装置および半導体装置の検査方法 |
-
1979
- 1979-02-05 JP JP1408379U patent/JPS55113979U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015072128A (ja) * | 2013-10-01 | 2015-04-16 | 三菱電機株式会社 | 半導体装置の検査装置および半導体装置の検査方法 |