JPS55104747A - X-ray diffraction divice - Google Patents

X-ray diffraction divice

Info

Publication number
JPS55104747A
JPS55104747A JP1148279A JP1148279A JPS55104747A JP S55104747 A JPS55104747 A JP S55104747A JP 1148279 A JP1148279 A JP 1148279A JP 1148279 A JP1148279 A JP 1148279A JP S55104747 A JPS55104747 A JP S55104747A
Authority
JP
Japan
Prior art keywords
detector
rays
arc
sample
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1148279A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6333097B2 (enExample
Inventor
Shigeru Ozaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Original Assignee
RIGAKU DENKI KK
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIGAKU DENKI KK, Rigaku Denki Co Ltd filed Critical RIGAKU DENKI KK
Priority to JP1148279A priority Critical patent/JPS55104747A/ja
Publication of JPS55104747A publication Critical patent/JPS55104747A/ja
Publication of JPS6333097B2 publication Critical patent/JPS6333097B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP1148279A 1979-02-05 1979-02-05 X-ray diffraction divice Granted JPS55104747A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1148279A JPS55104747A (en) 1979-02-05 1979-02-05 X-ray diffraction divice

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1148279A JPS55104747A (en) 1979-02-05 1979-02-05 X-ray diffraction divice

Publications (2)

Publication Number Publication Date
JPS55104747A true JPS55104747A (en) 1980-08-11
JPS6333097B2 JPS6333097B2 (enExample) 1988-07-04

Family

ID=11779264

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1148279A Granted JPS55104747A (en) 1979-02-05 1979-02-05 X-ray diffraction divice

Country Status (1)

Country Link
JP (1) JPS55104747A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2584187A1 (fr) * 1985-07-01 1987-01-02 Centre Nat Rech Scient Procede pour l'etude de la structure cristalline de monocristaux et dispositif pour la mise en oeuvre de ce procede
FR2587805A1 (fr) * 1985-09-24 1987-03-27 Univ Metz Procede et dispositif de determination de la texture cristallographique d'un materiau polycristallin
US4910758A (en) * 1988-08-09 1990-03-20 Amoco Corporation X-ray diffraction method for generating mineralogy record of whole core

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2584187A1 (fr) * 1985-07-01 1987-01-02 Centre Nat Rech Scient Procede pour l'etude de la structure cristalline de monocristaux et dispositif pour la mise en oeuvre de ce procede
FR2587805A1 (fr) * 1985-09-24 1987-03-27 Univ Metz Procede et dispositif de determination de la texture cristallographique d'un materiau polycristallin
US4910758A (en) * 1988-08-09 1990-03-20 Amoco Corporation X-ray diffraction method for generating mineralogy record of whole core

Also Published As

Publication number Publication date
JPS6333097B2 (enExample) 1988-07-04

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