JPS5483852A - Optical inspection device that use spherical mirror - Google Patents

Optical inspection device that use spherical mirror

Info

Publication number
JPS5483852A
JPS5483852A JP14405278A JP14405278A JPS5483852A JP S5483852 A JPS5483852 A JP S5483852A JP 14405278 A JP14405278 A JP 14405278A JP 14405278 A JP14405278 A JP 14405278A JP S5483852 A JPS5483852 A JP S5483852A
Authority
JP
Japan
Prior art keywords
inspection device
optical inspection
spherical mirror
use spherical
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14405278A
Other languages
English (en)
Other versions
JPS6222084B2 (ja
Inventor
Edowaado Reiba Piita
Moosu Goodon Jieison
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Technologies Corp
Original Assignee
United Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Technologies Corp filed Critical United Technologies Corp
Publication of JPS5483852A publication Critical patent/JPS5483852A/ja
Publication of JPS6222084B2 publication Critical patent/JPS6222084B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/205—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures of turbine blades or propellers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP14405278A 1977-11-26 1978-11-21 Optical inspection device that use spherical mirror Granted JPS5483852A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/855,116 US4183672A (en) 1977-11-26 1977-11-26 Optical inspection system employing spherical mirror

Publications (2)

Publication Number Publication Date
JPS5483852A true JPS5483852A (en) 1979-07-04
JPS6222084B2 JPS6222084B2 (ja) 1987-05-15

Family

ID=25320393

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14405278A Granted JPS5483852A (en) 1977-11-26 1978-11-21 Optical inspection device that use spherical mirror

Country Status (5)

Country Link
US (1) US4183672A (ja)
EP (1) EP0002428B1 (ja)
JP (1) JPS5483852A (ja)
CA (1) CA1103497A (ja)
DE (1) DE2862112D1 (ja)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5280179A (en) * 1979-04-30 1994-01-18 Sensor Adaptive Machines Incorporated Method and apparatus utilizing an orientation code for automatically guiding a robot
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5164579A (en) * 1979-04-30 1992-11-17 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects including light spot centroid determination
US4299491A (en) * 1979-12-11 1981-11-10 United Technologies Corporation Noncontact optical gauging system
JPS56168104A (en) * 1980-05-28 1981-12-24 Rikagaku Kenkyusho Detector for mark position
US4391514A (en) * 1981-02-13 1983-07-05 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Sidelooking laser altimeter for a flight simulator
US4534650A (en) * 1981-04-27 1985-08-13 Inria Institut National De Recherche En Informatique Et En Automatique Device for the determination of the position of points on the surface of a body
JPS58202751A (ja) * 1982-05-20 1983-11-26 Agency Of Ind Science & Technol 大口径金属鏡の超精密切削加工法
GB8307534D0 (en) * 1983-03-18 1983-04-27 Rolls Royce Optical determination of clearances
DE135495T1 (de) * 1983-07-28 1985-08-29 Polaroid Corp., Cambridge, Mass. Positionierungssystem mit differentialpositionierungssensoren.
US4590367A (en) * 1983-10-06 1986-05-20 Robotic Vision Systems, Inc. Arrangement for the expansion of the dynamic range of optical devices
DE3422143A1 (de) * 1984-06-14 1985-12-19 Josef Prof. Dr. Bille Geraet zur wafer-inspektion
CA2070822A1 (en) * 1989-12-05 1991-06-06 Herbert Barg Process and arrangement for optoelectronic measuring of objects
US5162659A (en) * 1991-03-06 1992-11-10 Northwest Airlines, Inc. Method and apparatus for noncontact inspection of engine blades
US5519204A (en) * 1994-04-25 1996-05-21 Cyberoptics Corporation Method and apparatus for exposure control in light-based measurement instruments
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
US6999183B2 (en) * 1998-11-18 2006-02-14 Kla-Tencor Corporation Detection system for nanometer scale topographic measurements of reflective surfaces
US20040035529A1 (en) * 1999-08-24 2004-02-26 Michael N. Grimbergen Monitoring a process and compensating for radiation source fluctuations
US8698891B2 (en) * 2011-03-09 2014-04-15 Zygo Corporation Object thickness and surface profile measurements
US11590992B2 (en) 2018-12-06 2023-02-28 Ensco, Inc. Systems and methods for analyzing a rail

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE868791C (de) * 1942-06-25 1953-02-26 Siemens Ag Einrichtung zur Messung kleiner Laengenaenderungen
US3246561A (en) * 1960-08-19 1966-04-19 Gen Aniline & Film Corp Catoptric illumination means
US3282149A (en) * 1963-04-10 1966-11-01 American Cyanamid Co Linear photoelectric refractometer
FR1483532A (fr) * 1966-06-16 1967-06-02 Boeing Co Appareil pour la détermination du contour de surface
GB1208505A (en) * 1967-07-04 1970-10-14 Leitz Ernst Gmbh A device for measuring distances or angles by photoelectric scanning
US3520607A (en) * 1967-10-17 1970-07-14 Hughes Aircraft Co Phase sensing laser contour mapper
US3606541A (en) * 1968-09-28 1971-09-20 Mitsubishi Electric Corp Contact-less probe system
DE1933719A1 (de) * 1969-07-03 1971-01-07 Leitz Ernst Gmbh Einrichtung zur Lagebestimmung von Werkstuecken
US3667846A (en) * 1969-07-28 1972-06-06 Charles Nater Optical surface inspection apparatus
GB1385912A (en) * 1971-09-07 1975-03-05 British Iron Steel Research Examining the cross-sectional profile of elongate articles
US4040738A (en) * 1975-03-20 1977-08-09 Gulton Industries, Inc. Railroad track profile spacing and alignment apparatus
JPS593791B2 (ja) * 1975-04-07 1984-01-26 キヤノン株式会社 物体の像認識方法
US3986774A (en) * 1975-05-08 1976-10-19 United Technologies Corporation Gauging surfaces by remotely tracking multiple images
US4147433A (en) * 1976-12-17 1979-04-03 United Technologies Corporation Contour inspection

Also Published As

Publication number Publication date
EP0002428B1 (en) 1982-12-01
JPS6222084B2 (ja) 1987-05-15
EP0002428A1 (en) 1979-06-13
US4183672A (en) 1980-01-15
DE2862112D1 (en) 1983-01-05
CA1103497A (en) 1981-06-23

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