JPS5476041A - Test pattern generator for logic circuit - Google Patents
Test pattern generator for logic circuitInfo
- Publication number
- JPS5476041A JPS5476041A JP14412577A JP14412577A JPS5476041A JP S5476041 A JPS5476041 A JP S5476041A JP 14412577 A JP14412577 A JP 14412577A JP 14412577 A JP14412577 A JP 14412577A JP S5476041 A JPS5476041 A JP S5476041A
- Authority
- JP
- Japan
- Prior art keywords
- test pattern
- subroutine
- logic circuit
- pattern generator
- escape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412577A JPS5476041A (en) | 1977-11-30 | 1977-11-30 | Test pattern generator for logic circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412577A JPS5476041A (en) | 1977-11-30 | 1977-11-30 | Test pattern generator for logic circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5476041A true JPS5476041A (en) | 1979-06-18 |
Family
ID=15354770
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14412577A Pending JPS5476041A (en) | 1977-11-30 | 1977-11-30 | Test pattern generator for logic circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5476041A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58208859A (ja) * | 1982-05-17 | 1983-12-05 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | テストシステムメモリ装置 |
US6286120B1 (en) | 1994-09-01 | 2001-09-04 | Teradyne, Inc. | Memory architecture for automatic test equipment using vector module table |
-
1977
- 1977-11-30 JP JP14412577A patent/JPS5476041A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58208859A (ja) * | 1982-05-17 | 1983-12-05 | フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン | テストシステムメモリ装置 |
JPH0354370B2 (ja) * | 1982-05-17 | 1991-08-20 | ||
US6286120B1 (en) | 1994-09-01 | 2001-09-04 | Teradyne, Inc. | Memory architecture for automatic test equipment using vector module table |
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