JPS544830B2 - - Google Patents

Info

Publication number
JPS544830B2
JPS544830B2 JP1536375A JP1536375A JPS544830B2 JP S544830 B2 JPS544830 B2 JP S544830B2 JP 1536375 A JP1536375 A JP 1536375A JP 1536375 A JP1536375 A JP 1536375A JP S544830 B2 JPS544830 B2 JP S544830B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1536375A
Other languages
Japanese (ja)
Other versions
JPS5190572A (en, 2012
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1536375A priority Critical patent/JPS544830B2/ja
Publication of JPS5190572A publication Critical patent/JPS5190572A/ja
Publication of JPS544830B2 publication Critical patent/JPS544830B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1536375A 1975-02-07 1975-02-07 Expired JPS544830B2 (en, 2012)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1536375A JPS544830B2 (en, 2012) 1975-02-07 1975-02-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1536375A JPS544830B2 (en, 2012) 1975-02-07 1975-02-07

Publications (2)

Publication Number Publication Date
JPS5190572A JPS5190572A (en, 2012) 1976-08-09
JPS544830B2 true JPS544830B2 (en, 2012) 1979-03-10

Family

ID=11886703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1536375A Expired JPS544830B2 (en, 2012) 1975-02-07 1975-02-07

Country Status (1)

Country Link
JP (1) JPS544830B2 (en, 2012)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5254381A (en) * 1975-10-29 1977-05-02 Mitsubishi Electric Corp Method of testing moisture resistance of semiconductor device
JPS5390767A (en) * 1977-01-20 1978-08-09 Matsushita Electric Ind Co Ltd Hermetic sealing testing method of semiconductor parts
JPS6039981U (ja) * 1983-08-27 1985-03-20 楠本化成株式会社 環境試験器
WO2009157037A1 (ja) * 2008-06-24 2009-12-30 アキム株式会社 電子部品検査装置、電子部品検査システム

Also Published As

Publication number Publication date
JPS5190572A (en, 2012) 1976-08-09

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